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Wenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth (abstract). Review of Scientific Instruments, 59 (8). 1849 doi:10.1063/1.1140080

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Reference TypeJournal (article/letter/editorial)
TitleX‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth (abstract)
JournalReview of Scientific Instruments
AuthorsWenzel, Kevin W.Author
Petrasso, Richard D.Author
Year1988 (August)Volume59
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.1140080Search in ResearchGate
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Mindat Ref. ID4850675Long-form Identifiermindat:1:5:4850675:9
GUID0
Full ReferenceWenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth (abstract). Review of Scientific Instruments, 59 (8). 1849 doi:10.1063/1.1140080
Plain TextWenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth (abstract). Review of Scientific Instruments, 59 (8). 1849 doi:10.1063/1.1140080
In(1988, August) Review of Scientific Instruments Vol. 59 (8) AIP Publishing

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Wenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth. Review of Scientific Instruments, 59 (8). 1380-1387 doi:10.1063/1.1139673
Lo, D. H., Petrasso, R. D., Wenzel, K. W., Coleman, J. W., Li, C. K., Lierzer, J. R., Hsieh, E., Bernat, T. (1992) Response of SBDs to MeV protons, tritons, and alphas: Evidence that the charged‐particle sensitive depth is not generally the depletion depth. Review of Scientific Instruments, 63 (10). 4850-4852 doi:10.1063/1.1143581
Wenzel, Kevin W., Li, Chi‐Kang, Petrasso, Richard D., Lo, Daniel H., Bautz, Marshall W., Ricker, George R., Hsieh, Ed (1993) Response of X‐UV photodiodes to 1.5–17.5 keV x rays and MeV alpha particles. Review of Scientific Instruments, 64 (7). 1723-1733 doi:10.1063/1.1144000
Wenzel, Kevin W., Petrasso, Richard D. (1990) X‐ray imaging arrays for impurity transport studies on the Texas Experimental Tokamak. Review of Scientific Instruments, 61 (2). 693-700 doi:10.1063/1.1141480
Petrasso, R. D., Wenzel, K. W. (1990) X‐ray imaging of impurity transport (abstract). Review of Scientific Instruments, 61 (10). 3144 doi:10.1063/1.1141710
Chen, Xing, Petrasso, Richard D. (1990) Sensitive depth of semiconductor radiation detectors in current and pulse mode operations (abstract). Review of Scientific Instruments, 61 (10). 2815 doi:10.1063/1.1141792
Li, C. K., Petrasso, R. D., Wenzel, K. W., Lo, D. H., Borrás, M. C. (1995) Comparative study of x‐ray sources characterizing x‐ray instrumentation. Review of Scientific Instruments, 66 (1). 697-699 doi:10.1063/1.1146261
Petrasso, R. D., Fiore, C. L., Li, Chi‐Kang (1988) γ‐ray diagnostic for the CIT. Review of Scientific Instruments, 59 (8). 1721-1722 doi:10.1063/1.1140145
Glendinning, S. G., Phillion, D. W., Kilkenny, J. D. (1988) Characterization of a high‐magnification x‐ray microscope on Nova (abstract). Review of Scientific Instruments, 59 (8). 1852 doi:10.1063/1.1140085
Lo, Daniel H., Petrasso, Richard D., Wenzel, Kevin W. (1992) Cluster‐impact fusion, or beam‐contaminant fusion? (abstract)a),b). Review of Scientific Instruments, 63 (10). 4853 doi:10.1063/1.1143529
Coleman, J. W., Wenzel, K. W., Li, C. K., Lo, D., Petrasso, R. D. (1990) γ‐ray and neutron calibration facility (abstract). Review of Scientific Instruments, 61 (10). 3234 doi:10.1063/1.1141653
 
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