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Wenzel, Kevin W., Li, Chi‐Kang, Petrasso, Richard D., Lo, Daniel H., Bautz, Marshall W., Ricker, George R., Hsieh, Ed (1993) Response of X‐UV photodiodes to 1.5–17.5 keV x rays and MeV alpha particles. Review of Scientific Instruments, 64 (7). 1723-1733 doi:10.1063/1.1144000

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Reference TypeJournal (article/letter/editorial)
TitleResponse of X‐UV photodiodes to 1.5–17.5 keV x rays and MeV alpha particles
JournalReview of Scientific Instruments
AuthorsWenzel, Kevin W.Author
Li, Chi‐KangAuthor
Petrasso, Richard D.Author
Lo, Daniel H.Author
Bautz, Marshall W.Author
Ricker, George R.Author
Hsieh, EdAuthor
Year1993 (July)Volume64
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1144000Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4865604Long-form Identifiermindat:1:5:4865604:5
GUID0
Full ReferenceWenzel, Kevin W., Li, Chi‐Kang, Petrasso, Richard D., Lo, Daniel H., Bautz, Marshall W., Ricker, George R., Hsieh, Ed (1993) Response of X‐UV photodiodes to 1.5–17.5 keV x rays and MeV alpha particles. Review of Scientific Instruments, 64 (7). 1723-1733 doi:10.1063/1.1144000
Plain TextWenzel, Kevin W., Li, Chi‐Kang, Petrasso, Richard D., Lo, Daniel H., Bautz, Marshall W., Ricker, George R., Hsieh, Ed (1993) Response of X‐UV photodiodes to 1.5–17.5 keV x rays and MeV alpha particles. Review of Scientific Instruments, 64 (7). 1723-1733 doi:10.1063/1.1144000
In(1993, July) Review of Scientific Instruments Vol. 64 (7) AIP Publishing

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Wenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth. Review of Scientific Instruments, 59 (8). 1380-1387 doi:10.1063/1.1139673
Wenzel, Kevin W., Petrasso, Richard D. (1988) X‐ray response of silicon surface‐barrier diodes at 8 and 17.5 keV: Evidence that the x‐ray sensitive depth is not generally the depletion depth (abstract). Review of Scientific Instruments, 59 (8). 1849 doi:10.1063/1.1140080
Li, C. K., Wenzel, K. W., Petrasso, R. D., Lo, D. H., Coleman, J. W., Lierzer, J. R., Hsieh, E., Bernat, T. (1992) PIXE x rays: From Z=4 to Z=92. Review of Scientific Instruments, 63 (10). 4843-4845 doi:10.1063/1.1143578
Lo, Daniel H., Petrasso, Richard D., Wenzel, Kevin W. (1992) Cluster‐impact fusion, or beam‐contaminant fusion? (abstract)a),b). Review of Scientific Instruments, 63 (10). 4853 doi:10.1063/1.1143529
Lo, D. H., Petrasso, R. D., Wenzel, K. W., Coleman, J. W., Li, C. K., Lierzer, J. R., Hsieh, E., Bernat, T. (1992) Response of SBDs to MeV protons, tritons, and alphas: Evidence that the charged‐particle sensitive depth is not generally the depletion depth. Review of Scientific Instruments, 63 (10). 4850-4852 doi:10.1063/1.1143581
Li, C. K., Petrasso, R. D., Wenzel, K. W., Lo, D. H., Borrás, M. C. (1995) Comparative study of x‐ray sources characterizing x‐ray instrumentation. Review of Scientific Instruments, 66 (1). 697-699 doi:10.1063/1.1146261
Lierzer, J. R., Wenzel, K. W., Petrasso, R. D., Lo, D. H., Coleman, J. W., Li, C. K., Hsieh, E., Bernat, T. (1992) A proton activation diagnostic to measure D–3He reaction yields. Review of Scientific Instruments, 63 (10). 4847-4849 doi:10.1063/1.1143580
Wenzel, K. W., Petrasso, R. D., Lo, D. H., Li, C. K., Coleman, J. W., Lierzer, J. R., Hsieh, E., Bernat, T. (1992) MIT fusion γ‐ray diagnostic development. Review of Scientific Instruments, 63 (10). 4840-4842 doi:10.1063/1.1143577
Wenzel, K. W., Lo, D. H., Petrasso, R. D., Coleman, J. W., Li, C. K., Lierzer, J. R., Borrás, C., Wei, T., Hsieh, E., Bernat, T. (1992) A fusion‐product source. Review of Scientific Instruments, 63 (10). 4837-4839 doi:10.1063/1.1143576
Wenzel, Kevin W., Petrasso, Richard D. (1990) X‐ray imaging arrays for impurity transport studies on the Texas Experimental Tokamak. Review of Scientific Instruments, 61 (2). 693-700 doi:10.1063/1.1141480
Coleman, J. W., Wenzel, K. W., Petrasso, R. D., Lo, D. H., Li, C. K., Lierzer, J. R., Wei, T. (1992) MIT modular x‐ray source systems for the study of plasma diagnostics. Review of Scientific Instruments, 63 (10). 4834-4836 doi:10.1063/1.1143575
 
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