Reference Type | Journal (article/letter/editorial) |
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Title | Current deep‐level transient spectroscopy in MOS structures with a boxcar integrator and an arbitrary gate‐width‐data analysis |
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Journal | Review of Scientific Instruments |
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Authors | Dmowski, K. | Author |
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Bethge, K. | Author |
Year | 1991 (April) | Volume | 62 |
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Issue | 4 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1142055Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4859105 | Long-form Identifier | mindat:1:5:4859105:8 |
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GUID | 0 |
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Full Reference | Dmowski, K., Bethge, K. (1991) Current deep‐level transient spectroscopy in MOS structures with a boxcar integrator and an arbitrary gate‐width‐data analysis. Review of Scientific Instruments, 62 (4). 1037-1046 doi:10.1063/1.1142055 |
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Plain Text | Dmowski, K., Bethge, K. (1991) Current deep‐level transient spectroscopy in MOS structures with a boxcar integrator and an arbitrary gate‐width‐data analysis. Review of Scientific Instruments, 62 (4). 1037-1046 doi:10.1063/1.1142055 |
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In | (1991, April) Review of Scientific Instruments Vol. 62 (4) AIP Publishing |
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