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Dmowski, K., Vuillaume, D., Lepley, B. (1996) A modified method of side data analysis of deep level transient spectroscopy spectra. Journal of Applied Physics, 79 (3). 1468-1475 doi:10.1063/1.360986

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Reference TypeJournal (article/letter/editorial)
TitleA modified method of side data analysis of deep level transient spectroscopy spectra
JournalJournal of Applied Physics
AuthorsDmowski, K.Author
Vuillaume, D.Author
Lepley, B.Author
Year1996 (February)Volume79
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.360986Search in ResearchGate
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Mindat Ref. ID5078412Long-form Identifiermindat:1:5:5078412:9
GUID0
Full ReferenceDmowski, K., Vuillaume, D., Lepley, B. (1996) A modified method of side data analysis of deep level transient spectroscopy spectra. Journal of Applied Physics, 79 (3). 1468-1475 doi:10.1063/1.360986
Plain TextDmowski, K., Vuillaume, D., Lepley, B. (1996) A modified method of side data analysis of deep level transient spectroscopy spectra. Journal of Applied Physics, 79 (3). 1468-1475 doi:10.1063/1.360986
In(1996, February) Journal of Applied Physics Vol. 79 (3) AIP Publishing

See Also

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Dmowski, K., Lepley, B., Losson, E., Bouabdellati, M. El (1993) A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes. Journal of Applied Physics, 74 (6). 3936-3943 doi:10.1063/1.354460
Dmowski, K., Lepley, B., Losson, E., Bouabdellati, M. El (1994) Erratum: ‘‘A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes’’ [J. Appl. Phys. 74, 3936 (1993)]. Journal of Applied Physics, 75 (6). 3226 doi:10.1063/1.356130
Stievenard, D., Vuillaume, D. (1986) Profiling of defects using deep level transient spectroscopy. Journal of Applied Physics, 60 (3). 973-979 doi:10.1063/1.337340
Bonde Nielsen, K., Andersen, E. (1996) Significance of blackbody radiation in deep‐level transient spectroscopy. Journal of Applied Physics, 79 (12). 9385-9387 doi:10.1063/1.362571
Dmowski, K., Vuillaume, D., Lepley, B., Losson, E., Bath, A. (1995) Interface state measurements by the DLS‐82E lock‐in spectrometer. Review of Scientific Instruments, 66 (8). 4283-4288 doi:10.1063/1.1145383
Dmowski, K., Bethge, K. (1991) Current deep‐level transient spectroscopy in MOS structures with a boxcar integrator and an arbitrary gate‐width‐data analysis. Review of Scientific Instruments, 62 (4). 1037-1046 doi:10.1063/1.1142055
Dmowski, K., Jakubowski, A. (1989) Deep‐level transient spectroscopy in MOS structures with a dual‐channel boxcar integrator and arbitrarily chosen gate‐width–data analysis. Review of Scientific Instruments, 60 (11). 3485-3491 doi:10.1063/1.1140498
Day, D. S., Tsai, M. Y., Streetman, B. G., Lang, D. V. (1979) Deep-level-transient spectroscopy: System effects and data analysis. Journal of Applied Physics, 50 (8). 5093pp. doi:10.1063/1.326665
Vuillaume, D., Lakhdari, H., Gambino, J. P. (1989) Deep level transient spectroscopy of metal‐oxide‐semiconductor capacitors fabricated on CF4reactive‐ion‐etched Si. Journal of Applied Physics, 66 (1). 230-235 doi:10.1063/1.343917
Ingham, Edward A., Scofield, James D., Pachter, Meir (1996) Improved linear prediction for deep level transient spectroscopy analysis. Journal of Applied Physics, 80 (5). 2805-2814 doi:10.1063/1.363133
Dmowski, K., Jakubowski, A. (1989) Sensitivity analysis of bulk traps detection in analog deep‐level transient spectroscopy measurement systems with exponentially weighted average. Review of Scientific Instruments, 60 (1). 106-112 doi:10.1063/1.1140592
 
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