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Lefebvre, W. (2013) Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM. Microscopy and Microanalysis, 19. 950-951 doi:10.1017/s1431927613006740

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Reference TypeJournal (article/letter/editorial)
TitleAtom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
JournalMicroscopy and Microanalysis
AuthorsLefebvre, W.Author
Year2013 (August)Volume19
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613006740Search in ResearchGate
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Mindat Ref. ID4863426Long-form Identifiermindat:1:5:4863426:5
GUID0
Full ReferenceLefebvre, W. (2013) Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM. Microscopy and Microanalysis, 19. 950-951 doi:10.1017/s1431927613006740
Plain TextLefebvre, W. (2013) Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM. Microscopy and Microanalysis, 19. 950-951 doi:10.1017/s1431927613006740
In(2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP)

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Lefebvre, W., Hernandez-Maldonado, D., Moyon, F., Cuvilly, F., Vaudolon, C., Shinde, D., Vurpillot, F. (2015) HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy. Ultramicroscopy, 159. 403-412 doi:10.1016/j.ultramic.2015.02.011
Prosa, T.J., Olson, D., Giddings, A.D., Lefebvre, W., Clifton, P.H., Larson, D.J. (2013) Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode. Microscopy and Microanalysis, 19. 1014-1015 doi:10.1017/s143192761300706x
Bachhav, M.N., Chang, S.-R., McFarland, A., Marquis, E.A., Clarkson, B. (2013) Quantitative Compositional Analysis of Fluorhydroxyapatite by Atom Probe Tomography. Microscopy and Microanalysis, 19. 184-185 doi:10.1017/s1431927613002912
Perea, Daniel, Wirth, Mark (2021) Prospects of mapping macromolecular structure and ionic gradients in hydrated biological specimens using Atom Probe Tomography. Microscopy and Microanalysis, 27. 1518 doi:10.1017/s1431927621005602
Diercks, D.R., Gorman, B.P. (2013) Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides. Microscopy and Microanalysis, 19. 962-963 doi:10.1017/s1431927613006806
Gault, B., Bouaziz, O. (2013) A Weibull Perspective on the Fracture of Atom Probe Specimens. Microscopy and Microanalysis, 19. 996-997 doi:10.1017/s1431927613006971
Gorman, B, Kelly, T (2011) Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography. Microscopy and Microanalysis, 17. 850-851 doi:10.1017/s1431927611005125
Miller, MK, Russell, KF, Hoelzer, DT (2008) Fabricating Atom Probe Tomography Specimens from TEM foils. Microscopy and Microanalysis, 14. 1022-1023 doi:10.1017/s1431927608081932
Miller, Michael K. (2004) Atom Probe Tomography and the Local Electrode Atom Probe. Microscopy and Microanalysis, 10. 150-151 doi:10.1017/s1431927604881157
MOYON, F., HERNANDEZ-MALDONADO, D., ROBERTSON, M.D., ETIENNE, A., CASTRO, C., LEFEBVRE, W. (2017) Reverse Monte Carlo reconstruction algorithm for discrete electron tomography based on HAADF-STEM atom counting. Journal of Microscopy, 265 (1). 73-80 doi:10.1111/jmi.12464
Kaluskar, K., Rajan, K. (2013) Gaussian Kernel Density Estimator for Voxel Size Selection in Atom Probe Tomography. Microscopy and Microanalysis, 19. 992-993 doi:10.1017/s1431927613006958
 
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