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Hutter, Jeffrey L., Bechhoefer, John (1993) Erratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]. Review of Scientific Instruments, 64 (11). 3342 doi:10.1063/1.1144449

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Reference TypeJournal (article/letter/editorial)
TitleErratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]
JournalReview of Scientific Instruments
AuthorsHutter, Jeffrey L.Author
Bechhoefer, JohnAuthor
Year1993 (November)Volume64
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.1144449Search in ResearchGate
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Mindat Ref. ID4864555Long-form Identifiermindat:1:5:4864555:3
GUID0
Full ReferenceHutter, Jeffrey L., Bechhoefer, John (1993) Erratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]. Review of Scientific Instruments, 64 (11). 3342 doi:10.1063/1.1144449
Plain TextHutter, Jeffrey L., Bechhoefer, John (1993) Erratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]. Review of Scientific Instruments, 64 (11). 3342 doi:10.1063/1.1144449
In(1993, November) Review of Scientific Instruments Vol. 64 (11) AIP Publishing

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Hutter, Jeffrey L., Bechhoefer, John (1993) Calibration of atomic‐force microscope tips. Review of Scientific Instruments, 64 (7). 1868-1873 doi:10.1063/1.1143970
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Stranick, S. J., Weiss, P. S. (1993) Erratum: A versatile microwave‐frequency‐compatible scanning tunneling microscope [Rev. Sci. Instrum. 64, 1232 (1993)]. Review of Scientific Instruments, 64 (7). 2039 doi:10.1063/1.1144448
Rollet, S., Batistoni, P. (1993) Erratum: Neutron transport studies for the Ignitor neutron diagnostics [Rev. Sci. Instrum. 63, 4551 (1992)]. Review of Scientific Instruments, 64 (5). 1371 doi:10.1063/1.1144447
Baselt, David R., Baldeschwieler, John D. (1993) Scanned‐cantilever atomic force microscope. Review of Scientific Instruments, 64 (4). 908-911 doi:10.1063/1.1144142
Szoszkiewicz, R. (2012) Comment on “Print your atomic force microscope” [Rev. Sci. Instrum. 78, 075105 (2007)]. Review of Scientific Instruments, 83 (3). 37101pp. doi:10.1063/1.3688654
Stiernstedt, Johanna, Rutland, Mark W., Attard, Phil (2006) Erratum: “A novel technique for the in situ calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76, 083710 (2005)]. Review of Scientific Instruments, 77 (1). 19901pp. doi:10.1063/1.2162429
Jensen, F. (1993) z calibration of the atomic force microscope by means of a pyramidal tip. Review of Scientific Instruments, 64 (9). 2595-2597 doi:10.1063/1.1143873
Tseytlin, Yakov M. (2008) Erratum: “Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method” [Rev. Sci. Instrum. 79, 025102 (2008)]. Review of Scientific Instruments, 79 (5). 59901pp. doi:10.1063/1.2937206
Hutter, Jeffrey L., Bechhoefer, John (1993) Manipulation of van der Waals forces to improve image resolution in atomic‐force microscopy. Journal of Applied Physics, 73 (9). 4123-4129 doi:10.1063/1.352845
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