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Hutter, Jeffrey L., Bechhoefer, John (1993) Calibration of atomic‐force microscope tips. Review of Scientific Instruments, 64 (7). 1868-1873 doi:10.1063/1.1143970

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Reference TypeJournal (article/letter/editorial)
TitleCalibration of atomic‐force microscope tips
JournalReview of Scientific Instruments
AuthorsHutter, Jeffrey L.Author
Bechhoefer, JohnAuthor
Year1993 (July)Volume64
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1143970Search in ResearchGate
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Mindat Ref. ID4865506Long-form Identifiermindat:1:5:4865506:4
GUID0
Full ReferenceHutter, Jeffrey L., Bechhoefer, John (1993) Calibration of atomic‐force microscope tips. Review of Scientific Instruments, 64 (7). 1868-1873 doi:10.1063/1.1143970
Plain TextHutter, Jeffrey L., Bechhoefer, John (1993) Calibration of atomic‐force microscope tips. Review of Scientific Instruments, 64 (7). 1868-1873 doi:10.1063/1.1143970
In(1993, July) Review of Scientific Instruments Vol. 64 (7) AIP Publishing

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Hutter, Jeffrey L., Bechhoefer, John (1993) Erratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]. Review of Scientific Instruments, 64 (11). 3342 doi:10.1063/1.1144449
Hutter, Jeffrey L., Bechhoefer, John (1993) Manipulation of van der Waals forces to improve image resolution in atomic‐force microscopy. Journal of Applied Physics, 73 (9). 4123-4129 doi:10.1063/1.352845
Jensen, F. (1993) z calibration of the atomic force microscope by means of a pyramidal tip. Review of Scientific Instruments, 64 (9). 2595-2597 doi:10.1063/1.1143873
Baselt, David R., Baldeschwieler, John D. (1993) Scanned‐cantilever atomic force microscope. Review of Scientific Instruments, 64 (4). 908-911 doi:10.1063/1.1144142
Li, Yang, Bechhoefer, John (2007) Feedforward control of a closed-loop piezoelectric translation stage for atomic force microscope. Review of Scientific Instruments, 78 (1). 13702pp. doi:10.1063/1.2403839
Reitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
Sader, John E., Larson, Ian, Mulvaney, Paul, White, Lee R. (1995) Method for the calibration of atomic force microscope cantilevers. Review of Scientific Instruments, 66 (7). 3789-3798 doi:10.1063/1.1145439
Baselt, David R., Baldeschwieler, John D. (1994) Comment on ‘‘Scanned‐cantilever atomic force microscope’’ [Rev. Sci. Instrum. 64, 908 (1993)]. Review of Scientific Instruments, 65 (6). 2160 doi:10.1063/1.1144721
Sader, John E., Chon, James W. M., Mulvaney, Paul (1999) Calibration of rectangular atomic force microscope cantilevers. Review of Scientific Instruments, 70 (10). 3967-3969 doi:10.1063/1.1150021
Scholl, D., Everson, M. P., Jaklevic, R. C. (1994) In situ force calibration of high force constant atomic force microscope cantilevers. Review of Scientific Instruments, 65 (7). 2255-2257 doi:10.1063/1.1144737
Bechhoefer, John, Hutter, Jeffrey L. (2021) Repulsive Casimir forces. Physics Today, 74 (4) 11 doi:10.1063/pt.3.4711
 
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