Simonson, R. J., Altamirano, M. M., Champetier, R. J., Cohen, M. R., Snyder, J., Stapp, R. S. (1993) A new design for an ultrahigh vacuum surface analysis chamber with optical scatter measurement capability. Review of Scientific Instruments, 64 (5). 1287-1291 doi:10.1063/1.1144081
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A new design for an ultrahigh vacuum surface analysis chamber with optical scatter measurement capability | ||
| Journal | Review of Scientific Instruments | ||
| Authors | Simonson, R. J. | Author | |
| Altamirano, M. M. | Author | ||
| Champetier, R. J. | Author | ||
| Cohen, M. R. | Author | ||
| Snyder, J. | Author | ||
| Stapp, R. S. | Author | ||
| Year | 1993 (May) | Volume | 64 |
| Issue | 5 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.1144081Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4865156 | Long-form Identifier | mindat:1:5:4865156:3 |
| GUID | 0 | ||
| Full Reference | Simonson, R. J., Altamirano, M. M., Champetier, R. J., Cohen, M. R., Snyder, J., Stapp, R. S. (1993) A new design for an ultrahigh vacuum surface analysis chamber with optical scatter measurement capability. Review of Scientific Instruments, 64 (5). 1287-1291 doi:10.1063/1.1144081 | ||
| Plain Text | Simonson, R. J., Altamirano, M. M., Champetier, R. J., Cohen, M. R., Snyder, J., Stapp, R. S. (1993) A new design for an ultrahigh vacuum surface analysis chamber with optical scatter measurement capability. Review of Scientific Instruments, 64 (5). 1287-1291 doi:10.1063/1.1144081 | ||
| In | (1993, May) Review of Scientific Instruments Vol. 64 (5) AIP Publishing | ||
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