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Schwarz, R. B., Rubin, J. B. (1993) Heating stage for in situ studies of thin‐film reactions. Review of Scientific Instruments, 64 (5). 1292-1295 doi:10.1063/1.1144082

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Reference TypeJournal (article/letter/editorial)
TitleHeating stage for in situ studies of thin‐film reactions
JournalReview of Scientific Instruments
AuthorsSchwarz, R. B.Author
Rubin, J. B.Author
Year1993 (May)Volume64
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1144082Search in ResearchGate
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Mindat Ref. ID4865158Long-form Identifiermindat:1:5:4865158:1
GUID0
Full ReferenceSchwarz, R. B., Rubin, J. B. (1993) Heating stage for in situ studies of thin‐film reactions. Review of Scientific Instruments, 64 (5). 1292-1295 doi:10.1063/1.1144082
Plain TextSchwarz, R. B., Rubin, J. B. (1993) Heating stage for in situ studies of thin‐film reactions. Review of Scientific Instruments, 64 (5). 1292-1295 doi:10.1063/1.1144082
In(1993, May) Review of Scientific Instruments Vol. 64 (5) AIP Publishing

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Haugdahl, J. B., Miller, D. R. (1988) In situ magnetization loop tracer for thin‐film growth. Review of Scientific Instruments, 59 (3). 480-483 doi:10.1063/1.1139865
Meiners, L. G., Hemmelman, B. T. (1993) A low‐cost induction power supply for substrate heating. Review of Scientific Instruments, 64 (5). 1296-1303 doi:10.1063/1.1144083
George, R. I., McQuistan, R. B. (1961) Lead Wire Attachment Technique for Thin Film Studies. Review of Scientific Instruments, 32 (7). 855-856 doi:10.1063/1.1717532
Plano, R. J., Safinya, C. R., Sirota, E. B., Wenzel, L. J. (1993) X‐ray Couette shear cell for nonequilibrium structural studies of complex fluids under flow. Review of Scientific Instruments, 64 (5). 1309-1318 doi:10.1063/1.1144085
Frankel, D. J., Fruhberger, B., Jackson, R. H., Dwyer, D. J. (1993) Ultrahigh vacuum cold finger for surface reaction studies. Review of Scientific Instruments, 64 (8). 2368-2370 doi:10.1063/1.1143936
Brady, M. J., Davidson, A. (1983) Correction for chromatic aberration in microscope projection photolithography. Review of Scientific Instruments, 54 (10). 1292-1295 doi:10.1063/1.1137239
Witt, Ch., Mick, U., Bode, M., Wiesendanger, R. (1997) An ultrahigh vacuum scanning tunneling microscope for in situ studies of thin-film growth. Review of Scientific Instruments, 68 (3). 1455-1457 doi:10.1063/1.1147951
Wood, J. W., Redin, R. D. (1993) A simple profilometer for film thickness measurement. Review of Scientific Instruments, 64 (8). 2405-2406 doi:10.1063/1.1143897
Isaac, R. D., Schwarz, R. B. (1975) Simple persistent switch for superconducting solenoids. Review of Scientific Instruments, 46 (5). 638 doi:10.1063/1.1134249
Reinink, J., van de Kruijs, R. W. E., Bijkerk, F. (2018) Self-contained in-vacuum in situ thin film stress measurement tool. Review of Scientific Instruments, 89 (5). 53904pp. doi:10.1063/1.5021790
Sherman, Dudley M., Hutchinson, Thos. E. (1972) Instrumentation for In Situ Electron Microscope Studies of Sputtered Thin Film Growth. Review of Scientific Instruments, 43 (12). 1793-1796 doi:10.1063/1.1685567
 
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