Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Nowakowski, P., Bonifacio, C.S., Campin, M.J., Ray, M.L., Fischione, P.E. (2017) Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation. Microscopy and Microanalysis, 23. 300-301 doi:10.1017/s1431927617002185

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAccurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation
JournalMicroscopy and Microanalysis
AuthorsNowakowski, P.Author
Bonifacio, C.S.Author
Campin, M.J.Author
Ray, M.L.Author
Fischione, P.E.Author
Year2017 (July)Volume23
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927617002185Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4879710Long-form Identifiermindat:1:5:4879710:2
GUID0
Full ReferenceNowakowski, P., Bonifacio, C.S., Campin, M.J., Ray, M.L., Fischione, P.E. (2017) Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation. Microscopy and Microanalysis, 23. 300-301 doi:10.1017/s1431927617002185
Plain TextNowakowski, P., Bonifacio, C.S., Campin, M.J., Ray, M.L., Fischione, P.E. (2017) Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation. Microscopy and Microanalysis, 23. 300-301 doi:10.1017/s1431927617002185
In(2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP)

See Also

These are possibly similar items as determined by title/reference text matching only.

Bonifacio, C.S., Campin, M.J., Nowakowski, P., Boccabella, M., Giannuzzi, L.A., Fischione, P.E. (2017) Targeted Ion Milling of Ex Situ Lift-Out FIB Specimens. Microscopy and Microanalysis, 23. 268-269 doi:10.1017/s1431927617002021
Campin, M.J., Bonifacio, C.S., Kang, H.H., Nowakowski, P., Boccabella, M., Fischione, P.E. (2017) Narrow-Beam Argon Ion Milling of Carbon-Supported Ex Situ Lift-Out FIB Specimens. Microscopy and Microanalysis, 23. 302-303 doi:10.1017/s1431927617002197
Bonifacio, C.S., Tan, S., Nowakowski, P., Ray, M.L., Fischione, P.E. (2022) Raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens. Microscopy and Microanalysis, 28. 52-53 doi:10.1017/s143192762200112x
Campin, M.J., Bonifacio, C.S., Fischione, P.E. (2018) Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens. Microscopy and Microanalysis, 24. 862-863 doi:10.1017/s1431927618004804
Bonifacio, C.S., Nowakowski, P., Costello, K., Ray, M.L., Morrison, R., Fischione, P.E. (2019) Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy. Microscopy and Microanalysis, 25. 2554-2555 doi:10.1017/s1431927619013503
Bonifacio, C.S., Campin, M., McIlwrath, K., Ray, M., Fischione, P.E. (2018) Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits. Microscopy and Microanalysis, 24. 150-151 doi:10.1017/s1431927618001241
Bonifacio, C.S., Nowakowski, P., Costello, K., Ray, M.L., Morrison, R., Fischione, P.E. (2019) Controlled Environments from Sample Preparation to Electron Microscopy Characterization. Microscopy and Microanalysis, 25. 698-699 doi:10.1017/s1431927619004227
Bonifacio, C.S., Giannuzzi, L.A., Nowakowski, P., Harbaugh, J.T., Campin, M., Boccabella, M., Ray, M., Fischione, P.E. (2018) Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices. Microscopy and Microanalysis, 24. 854-855 doi:10.1017/s1431927618004762
Bonifacio, C.S., Perea, D., Nowakowski, P., Ray, M.L., Fischione, P. (2022) Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments. Microscopy and Microanalysis, 28. 3176-3178 doi:10.1017/s1431927622011795
Nowakowski, P., Ray, M.L., Fischione, P.E. (2017) Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling. Microscopy and Microanalysis, 23. 12-13 doi:10.1017/s1431927617000745
Bonifacio, C S, Nowakowski, P, Ray, M L, Fischione, P E (2024) Latest Developments in Post-FIB Concentrated Ar Ion Beam Milling of TEM Specimens with Large Electron-transparent Areas. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.1091
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 28, 2025 04:20:13
Go to top of page