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Koop, Th., Schindler, W., Kazimirov, A., Scherb, G., Zegenhagen, J., Schulz, Th., Feidenhans’l, R., Kirschner, J. (1998) Electrochemical cell for in situ x-ray diffraction under ultrapure conditions. Review of Scientific Instruments, 69 (4). 1840-1843 doi:10.1063/1.1148852

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Reference TypeJournal (article/letter/editorial)
TitleElectrochemical cell for in situ x-ray diffraction under ultrapure conditions
JournalReview of Scientific Instruments
AuthorsKoop, Th.Author
Schindler, W.Author
Kazimirov, A.Author
Scherb, G.Author
Zegenhagen, J.Author
Schulz, Th.Author
Feidenhans’l, R.Author
Kirschner, J.Author
Year1998 (April)Volume69
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.1148852Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4879952Long-form Identifiermindat:1:5:4879952:6
GUID0
Full ReferenceKoop, Th., Schindler, W., Kazimirov, A., Scherb, G., Zegenhagen, J., Schulz, Th., Feidenhans’l, R., Kirschner, J. (1998) Electrochemical cell for in situ x-ray diffraction under ultrapure conditions. Review of Scientific Instruments, 69 (4). 1840-1843 doi:10.1063/1.1148852
Plain TextKoop, Th., Schindler, W., Kazimirov, A., Scherb, G., Zegenhagen, J., Schulz, Th., Feidenhans’l, R., Kirschner, J. (1998) Electrochemical cell for in situ x-ray diffraction under ultrapure conditions. Review of Scientific Instruments, 69 (4). 1840-1843 doi:10.1063/1.1148852
In(1998, April) Review of Scientific Instruments Vol. 69 (4) AIP Publishing

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Scherb, G., Kazimirov, A., Zegenhagen, J. (1998) A novel thick-layer electrochemical cell for in situ x-ray diffraction. Review of Scientific Instruments, 69 (2). 512-516 doi:10.1063/1.1148723
Schindler, W., Koop, Th., Kazimirov, A., Scherb, G., Zegenhagen, J., Schultz, Th., Feidenhans'l, R., Kirschner, J. (2000) Non-coherent growth patches in pseudomorphic films: Unusual strain relief in electrodeposited Co on Cu(001). Surface Science, 465 (3). doi:10.1016/s0039-6028(00)00779-2
Schindler, W., Kirschner, J. (1996) New electrochemical cell for in situ tunneling microscopy, cyclovoltammetry, and optical measurements. Review of Scientific Instruments, 67 (10). 3578-3582 doi:10.1063/1.1147176
Scherb, G., Kazimirov, A., Zegenhagen, J., Schultz, T., Feidenhans’l, R., Fimland, B. O. (1997) Potential controlled stripping of an amorphous As layer on GaAs(001) in an electrolyte: Anin situx-ray scattering study. Applied Physics Letters, 71 (20). 2990-2992 doi:10.1063/1.120239
Zegenhagen, J., Kazimirov, A., Scherb, G., Kolb, D.M., Smilgies, D.-M., Feidenhans'l, R. (1996) X-ray diffraction study of a semiconductor/electrolyte interface:. Surface Science, 352. 346-351 doi:10.1016/0039-6028(95)01158-7
Robinson, K. M., O’Grady, W. E. (1993) A transmission geometry electrochemical cell for in situ x‐ray diffraction. Review of Scientific Instruments, 64 (4). 1061-1065 doi:10.1063/1.1144178
Lee, T.-L., Kumpf, C., Kazimirov, A., Lyman, P. F., Scherb, G., Bedzyk, M. J., Nielsen, M., Feidenhans’l, R., Johnson, R. L., Fimland, B. O., Zegenhagen, J. (2002) Structural analysis of the indium-stabilizedGaAs(001)−c(8×2)surface. Physical Review B, 66 (23) doi:10.1103/physrevb.66.235301
Scherb, G., Kazimirov, A., Zegenhagen, J., Lee, T. L., Bedzyk, M. J., Noguchi, H., Uosaki, K. (1998) In situx-ray standing-wave analysis of electrodeposited Cu monolayers on GaAs(001) Physical Review B, 58 (16) 10800-10805 doi:10.1103/physrevb.58.10800
Schindler, W., Koop, Th., Kirschner, J. (1999) Growth and Magnetism of Ultrathin Electrodeposited Co Films*. Zeitschrift für Physikalische Chemie, 208. 93-106 doi:10.1524/zpch.1999.208.part_1_2.093
Schindler, W., Koop, Th., Kirschner, J. (1997) Growth and Magnetism of Ultrathin Electrodeposited Co Films*. Zeitschrift für Physikalische Chemie, 1 (1). 93-106 doi:10.1524/zpch.1997.1.1.093
Kazimirov, A., Scherb, G., Zegenhagen, J., Lee, T.-L., Bedzyk, M. J., Kelly, M. K., Angerer, H., Ambacher, O. (1998) Polarity determination of a GaN thin film on sapphire (0001) with x-ray standing waves. Journal of Applied Physics, 84 (3). 1703-1705 doi:10.1063/1.368240
 
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