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Hagmann, Mark J., Yarotski, Dmitry A., Mousa, Marwan S. (2017) Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and Microanalysis, 23 (2). 443-448 doi:10.1017/s1431927616012563

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Reference TypeJournal (article/letter/editorial)
TitleMicrowave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope
JournalMicroscopy and Microanalysis
AuthorsHagmann, Mark J.Author
Yarotski, Dmitry A.Author
Mousa, Marwan S.Author
Year2017 (April)Volume23
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927616012563Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4882009Long-form Identifiermindat:1:5:4882009:3
GUID0
Full ReferenceHagmann, Mark J., Yarotski, Dmitry A., Mousa, Marwan S. (2017) Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and Microanalysis, 23 (2). 443-448 doi:10.1017/s1431927616012563
Plain TextHagmann, Mark J., Yarotski, Dmitry A., Mousa, Marwan S. (2017) Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and Microanalysis, 23 (2). 443-448 doi:10.1017/s1431927616012563
In(2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP)

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Hagmann, Mark J., Mousa, Marwan S., Yarotski, Dmitry A. (2017) Resolution in Carrier Profiling Semiconductors by Scanning Spreading Resistance Microscopy and Scanning Frequency Comb Microscopy. Applied Microscopy, 47. 95-100 doi:10.9729/am.2017.47.3.95
Wiedemeier, Jeremy, Spencer, Greg, Hagmann, Mark J., Mousa, Marwan S. (2019) Simulation and Analysis of Methods for Scanning Tunneling Microscopy Feedback Control. Microscopy and Microanalysis, 25 (2). 554-560 doi:10.1017/s1431927619000278
Hagmann, Mark J., Stenger, Frank S., Yarotski, Dmitry A. (2013) Linewidth of the harmonics in a microwave frequency comb generated by focusing a mode-locked ultrafast laser on a tunneling junction. Journal of Applied Physics, 114 (22). 223107pp. doi:10.1063/1.4831952
Hagmann, Mark J., Taylor, Antoinette J., Yarotski, Dmitry A. (2012) Observation of 200th harmonic with fractional linewidth of 10−10 in a microwave frequency comb generated in a tunneling junction. Applied Physics Letters, 101 (24). 241102pp. doi:10.1063/1.4769982
Hagmann, Mark J., Efimov, Anatoly, Taylor, Antoinette J., Yarotski, Dzmitry A. (2011) Microwave frequency-comb generation in a tunneling junction by intermode mixing of ultrafast laser pulses. Applied Physics Letters, 99 (1). 11112pp. doi:10.1063/1.3607482
Hagmann, Mark, Spencer, Greg, Wiedemeier, Jeremy (2018) Virtual Scanning Tunneling Microscope Offered as a Free-Download. Microscopy Today, 26 (3). 18-23 doi:10.1017/s1551929518000019
Hagmann, M. J., Pandey, S., Nahata, A., Taylor, A. J., Yarotski, D. A. (2012) Microwave frequency comb attributed to the formation of dipoles at the surface of a semiconductor by a mode-locked ultrafast laser. Applied Physics Letters, 101 (23). 231102pp. doi:10.1063/1.4768952
Almarsi, Ayman M., Hagmann, Mark J., Mousa, Marwan S. (2017) Enhanced Field Electron Emission from Dielectric Coated Highly Emissive Carbon Fibers. Applied Microscopy, 47. 55-62 doi:10.9729/am.2017.47.1.55
Al-Qudah, Ala’a M., Alnawasreh, Shady S., Madanat, Mazen A., Trzaska, Oliwia, Matykiewicz, Danuta, Alrawshdeh, Saad S., Hagmann, Mark J., Mousa, Marwan S. (2017) The Effects of Dielectric Coatings on Electron Emission from Tungsten. Applied Microscopy, 47. 36-42 doi:10.9729/am.2017.47.1.36
Herzing, Andrew A. (2017) Quantitative Aspects of 3D Chemical Tomography in the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 23. 1030-1031 doi:10.1017/s1431927617005815
Collins, George J. (1995) A Scanning Probe Microscope in My Scanning Electron Microscope?. Microscopy Today, 3 (2). 22-23 doi:10.1017/s1551929500063112
 
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