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(2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP)

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Reference TypeJournal (issue)
JournalMicroscopy and Microanalysis
Year2017 (April)Volume23
Issue<   2   >
PublisherCambridge University Press (CUP)
Mindat Ref. ID4882005Long-form Identifiermindat:1:5:4882005:7
GUID0
Full Reference(2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP)
Plain Text(2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP)
In(2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP)

Contains

(2017) MAM volume 23 issue 2 Cover and Front matter. Microscopy and Microanalysis, 23 (2). doi:10.1017/s1431927617000393
(2017) MAM volume 23 issue 2 Cover and Back matter. Microscopy and Microanalysis, 23 (2). doi:10.1017/s143192761700040x
(2017) Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea. Microscopy and Microanalysis, 23 (2). 187-193 doi:10.1017/s1431927617000411
Prosa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642
Vurpillot, Francois, Danoix, Frédéric, Gilbert, Matthieu, Koelling, Sebastian, Dagan, Michal, Seidman, David N. (2017) True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy. Microscopy and Microanalysis, 23 (2). 210-220 doi:10.1017/s1431927617000198
Zhao, Lu, Normand, Antoine, Houard, Jonathan, Blum, Ivan, Delaroche, Fabien, Latry, Olivier, Ravelo, Blaise, Vurpillot, Francois (2017) Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. Microscopy and Microanalysis, 23 (2). 221-226 doi:10.1017/s1431927616012666
Martin, Tomas L., London, Andrew J., Jenkins, Benjamin, Hopkin, Sarah E., Douglas, James O., Styman, Paul D., Bagot, Paul A. J., Moody, Michael P. (2017) Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments. Microscopy and Microanalysis, 23 (2). 227-237 doi:10.1017/s1431927617000356
De Geuser, Frédéric, Gault, Baptiste (2017) Reflections on the Projection of Ions in Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 238-246 doi:10.1017/s1431927616012721
Rolland, Nicolas, Vurpillot, François, Duguay, Sébastien, Mazumder, Baishakhi, Speck, James S., Blavette, Didier (2017) New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. Microscopy and Microanalysis, 23 (2). 247-254 doi:10.1017/s1431927617000253
Dagan, Michal, Gault, Baptiste, Smith, George D. W., Bagot, Paul A. J., Moody, Michael P. (2017) Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data. Microscopy and Microanalysis, 23 (2). 255-268 doi:10.1017/s1431927617000277
Zelenty, Jennifer, Dahl, Andrew, Hyde, Jonathan, Smith, George D. W., Moody, Michael P. (2017) Detecting Clusters in Atom Probe Data with Gaussian Mixture Models. Microscopy and Microanalysis, 23 (2). 269-278 doi:10.1017/s1431927617000320
Breen, Andrew J., Babinsky, Katharina, Day, Alec C., Eder, K., Oakman, Connor J., Trimby, Patrick W., Primig, Sophie, Cairney, Julie M., Ringer, Simon P. (2017) Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data. Microscopy and Microanalysis, 23 (2). 279-290 doi:10.1017/s1431927616012605
Stoffers, Andreas, Barthel, Juri, Liebscher, Christian H., Gault, Baptiste, Cojocaru-Mirédin, Oana, Scheu, Christina, Raabe, Dierk (2017) Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries. Microscopy and Microanalysis, 23 (2). 291-299 doi:10.1017/s1431927617000034
London, Andrew J., Haley, Daniel, Moody, Michael P. (2017) Single-Ion Deconvolution of Mass Peak Overlaps for Atom Probe Microscopy. Microscopy and Microanalysis, 23 (2). 300-306 doi:10.1017/s1431927616012782
Haley, Daniel, Bagot, Paul A. J., Moody, Michael P. (2017) Atom Probe Analysis of Ex Situ Gas-Charged Stable Hydrides. Microscopy and Microanalysis, 23 (2). 307-313 doi:10.1017/s1431927616012630
Pfeiffer, Björn, Maier, Johannes, Arlt, Jonas, Nowak, Carsten (2017) In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide. Microscopy and Microanalysis, 23 (2). 314-320 doi:10.1017/s1431927616012691
Diercks, David R., Gorman, Brian P., Mulders, Johannes J. L. (2017) Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers. Microscopy and Microanalysis, 23 (2). 321-328 doi:10.1017/s1431927616011740
Kwak, Chang-Min, Kim, Young-Tae, Park, Chan-Gyung, Seol, Jae-Bok (2017) Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy. Microscopy and Microanalysis, 23 (2). 329-335 doi:10.1017/s1431927617000149
Nishikawa, Osamu, Taniguchi, Masahiro (2017) Toward the Atomic-Level Mass Analysis of Biomolecules by the Scanning Atom Probe. Microscopy and Microanalysis, 23 (2). 336-339 doi:10.1017/s1431927616012551
Wang, Zemin, Fang, Xulei, Li, Hui, Liu, Wenqing (2017) Atom Probe Tomographic Characterization of Nanoscale Cu-Rich Precipitates in 17-4 Precipitate Hardened Stainless Steel Tempered at Different Temperatures. Microscopy and Microanalysis, 23 (2). 340-349 doi:10.1017/s1431927616012629
Shen, Qin, Chen, Hao, Liu, Wenqing (2017) Effect of Cu on Nanoscale Precipitation Evolution and Mechanical Properties of a Fe–NiAl Alloy. Microscopy and Microanalysis, 23 (2). 350-359 doi:10.1017/s1431927616012599
Rashidi, Masoud, Andrén, Hans-Olof, Liu, Fang (2017) Core-Shell Structure of Intermediate Precipitates in a Nb-Based Z-Phase Strengthened 12% Cr Steel. Microscopy and Microanalysis, 23 (2). 360-365 doi:10.1017/s1431927617000174
Hyde, Jonathan M., DaCosta, Gérald, Hatzoglou, Constantinos, Weekes, Hannah, Radiguet, Bertrand, Styman, Paul D., Vurpillot, Francois, Pareige, Cristelle, Etienne, Auriane, Bonny, Giovanni, Castin, Nicolas, Malerba, Lorenzo, Pareige, Philippe (2017) Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data. Microscopy and Microanalysis, 23 (2). 366-375 doi:10.1017/s1431927616012678
Lindgren, Kristina, Stiller, Krystyna, Efsing, PÃ¥l, Thuvander, Mattias (2017) On the Analysis of Clustering in an Irradiated Low Alloy Reactor Pressure Vessel Steel Weld. Microscopy and Microanalysis, 23 (2). 376-384 doi:10.1017/s1431927617000162
Langelier, Brian, Van Landeghem, Hugo P., Botton, Gianluigi A., Zurob, Hatem S. (2017) Interface Segregation and Nitrogen Measurement in Fe–Mn–N Steel by Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 385-395 doi:10.1017/s1431927617000150
Boll, Torben, Unocic, Kinga A., Pint, Bruce A., Stiller, Krystyna (2017) Interfaces in Oxides Formed on NiAlCr Doped with Y, Hf, Ti, and B. Microscopy and Microanalysis, 23 (2). 396-403 doi:10.1017/s1431927617000186
La Fontaine, Alexandre, Piazolo, Sandra, Trimby, Patrick, Yang, Limei, Cairney, Julie M. (2017) Laser-Assisted Atom Probe Tomography of Deformed Minerals: A Zircon Case Study. Microscopy and Microanalysis, 23 (2). 404-413 doi:10.1017/s1431927616012745
Pedrazzini, Stella, London, Andrew J., Gault, Baptiste, Saxey, David, Speller, Susannah, Grovenor, Chris R. M., Danaie, Mohsen, Moody, Michael P., Edmondson, Philip D., Bagot, Paul A. J. (2017) Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 414-424 doi:10.1017/s1431927616012757
Ren, Kezhi, Tan, Xiaohua, Li, Heyun, Xu, Hui, Han, Ke (2017) The Effects of the Addition of Dy, Nb, and Ga on Microstructure and Magnetic Properties of Nd2Fe14B/α-Fe Nanocomposite Permanent Magnetic Alloys. Microscopy and Microanalysis, 23 (2). 425-430 doi:10.1017/s1431927616012770
Peng, Zirong, Choi, Pyuck-Pa, Gault, Baptiste, Raabe, Dierk (2017) Evaluation of Analysis Conditions for Laser-Pulsed Atom Probe Tomography: Example of Cemented Tungsten Carbide. Microscopy and Microanalysis, 23 (2). 431-442 doi:10.1017/s1431927616012654
Hagmann, Mark J., Yarotski, Dmitry A., Mousa, Marwan S. (2017) Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope. Microscopy and Microanalysis, 23 (2). 443-448 doi:10.1017/s1431927616012563

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