Wang, Zemin, Fang, Xulei, Li, Hui, Liu, Wenqing (2017) Atom Probe Tomographic Characterization of Nanoscale Cu-Rich Precipitates in 17-4 Precipitate Hardened Stainless Steel Tempered at Different Temperatures. Microscopy and Microanalysis, 23 (2). 340-349 doi:10.1017/s1431927616012629
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Atom Probe Tomographic Characterization of Nanoscale Cu-Rich Precipitates in 17-4 Precipitate Hardened Stainless Steel Tempered at Different Temperatures | ||
Journal | Microscopy and Microanalysis | ||
Authors | Wang, Zemin | Author | |
Fang, Xulei | Author | ||
Li, Hui | Author | ||
Liu, Wenqing | Author | ||
Year | 2017 (April) | Volume | 23 |
Issue | 2 | ||
Publisher | Cambridge University Press (CUP) | ||
DOI | doi:10.1017/s1431927616012629Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4882015 | Long-form Identifier | mindat:1:5:4882015:4 |
GUID | 0 | ||
Full Reference | Wang, Zemin, Fang, Xulei, Li, Hui, Liu, Wenqing (2017) Atom Probe Tomographic Characterization of Nanoscale Cu-Rich Precipitates in 17-4 Precipitate Hardened Stainless Steel Tempered at Different Temperatures. Microscopy and Microanalysis, 23 (2). 340-349 doi:10.1017/s1431927616012629 | ||
Plain Text | Wang, Zemin, Fang, Xulei, Li, Hui, Liu, Wenqing (2017) Atom Probe Tomographic Characterization of Nanoscale Cu-Rich Precipitates in 17-4 Precipitate Hardened Stainless Steel Tempered at Different Temperatures. Microscopy and Microanalysis, 23 (2). 340-349 doi:10.1017/s1431927616012629 | ||
In | (2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP) |
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