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Tian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700

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Reference TypeJournal (article/letter/editorial)
TitleDirect temperature monitoring for semiconductors in plasma immersion ion implantation
JournalReview of Scientific Instruments
AuthorsTian, XiuboAuthor
Chu, Paul K.Author
Year2000 (July)Volume71
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1150700Search in ResearchGate
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Mindat Ref. ID4884080Long-form Identifiermindat:1:5:4884080:2
GUID0
Full ReferenceTian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700
Plain TextTian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700
In(2000, July) Review of Scientific Instruments Vol. 71 (7) AIP Publishing


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