Tian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Direct temperature monitoring for semiconductors in plasma immersion ion implantation | ||
Journal | Review of Scientific Instruments | ||
Authors | Tian, Xiubo | Author | |
Chu, Paul K. | Author | ||
Year | 2000 (July) | Volume | 71 |
Issue | 7 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1150700Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4884080 | Long-form Identifier | mindat:1:5:4884080:2 |
GUID | 0 | ||
Full Reference | Tian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700 | ||
Plain Text | Tian, Xiubo, Chu, Paul K. (2000) Direct temperature monitoring for semiconductors in plasma immersion ion implantation. Review of Scientific Instruments, 71 (7). 2839-2842 doi:10.1063/1.1150700 | ||
In | (2000, July) Review of Scientific Instruments Vol. 71 (7) AIP Publishing |
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