Bonnell, D., Bischoff, E. (1987) Uncertainty analysis for low P:B xeds measurements - variation of aluminum in silicon nitride. Ultramicroscopy, 22 (1). 191-196 doi:10.1016/0304-3991(87)90062-3
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Uncertainty analysis for low P:B xeds measurements - variation of aluminum in silicon nitride | ||
Journal | Ultramicroscopy | ||
Authors | Bonnell, D. | Author | |
Bischoff, E. | Author | ||
Year | 1987 (January) | Volume | 22 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0304-3991(87)90062-3Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4893459 | Long-form Identifier | mindat:1:5:4893459:0 |
GUID | 0 | ||
Full Reference | Bonnell, D., Bischoff, E. (1987) Uncertainty analysis for low P:B xeds measurements - variation of aluminum in silicon nitride. Ultramicroscopy, 22 (1). 191-196 doi:10.1016/0304-3991(87)90062-3 | ||
Plain Text | Bonnell, D., Bischoff, E. (1987) Uncertainty analysis for low P:B xeds measurements - variation of aluminum in silicon nitride. Ultramicroscopy, 22 (1). 191-196 doi:10.1016/0304-3991(87)90062-3 | ||
In | (1987, January) Ultramicroscopy Vol. 22 (1) Elsevier BV |
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