Vote for your favorite mineral in #MinCup25! - Pectolite vs. Haüyne
It's a pair of striking blue beauties as #pectolite the uncrushable faces off against #hauyne, the phoenix from volcanic ashes!
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Donlon, W.T., James, J.V., Bomback, J.L., Huo, C.R., Wang, Charles C. (1987) Characterization of ion implanted silicon: correlation of optical measurements with microstructural observations. Ultramicroscopy, 22 (1). 305-317 doi:10.1016/0304-3991(87)90074-x

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleCharacterization of ion implanted silicon: correlation of optical measurements with microstructural observations
JournalUltramicroscopy
AuthorsDonlon, W.T.Author
James, J.V.Author
Bomback, J.L.Author
Huo, C.R.Author
Wang, Charles C.Author
Year1987 (January)Volume22
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90074-xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4893485Long-form Identifiermindat:1:5:4893485:5
GUID0
Full ReferenceDonlon, W.T., James, J.V., Bomback, J.L., Huo, C.R., Wang, Charles C. (1987) Characterization of ion implanted silicon: correlation of optical measurements with microstructural observations. Ultramicroscopy, 22 (1). 305-317 doi:10.1016/0304-3991(87)90074-x
Plain TextDonlon, W.T., James, J.V., Bomback, J.L., Huo, C.R., Wang, Charles C. (1987) Characterization of ion implanted silicon: correlation of optical measurements with microstructural observations. Ultramicroscopy, 22 (1). 305-317 doi:10.1016/0304-3991(87)90074-x
In(1987, January) Ultramicroscopy Vol. 22 (1) Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

(1987) Editorial Board. Ultramicroscopy, 22 (1). doi:10.1016/0304-3991(87)90043-x
Wang, Charles C., Bomback, J., Donlon, W. T., Huo, C. R., James, J. V. (1986) Optical Third-Harmonic Generation in Reflection from Crystalline and Amorphous Samples of Silicon. Physical Review Letters, 57 (13). 1647-1650 doi:10.1103/physrevlett.57.1647
Bonnell, D., Bischoff, E. (1987) Uncertainty analysis for low P:B xeds measurements - variation of aluminum in silicon nitride. Ultramicroscopy, 22 (1). 191-196 doi:10.1016/0304-3991(87)90062-3
Gibbons, P.C., Bradley, C.R., Fraundorf, P.B. (1987) How to remove multiple scattering from core-excitation spectra. Ultramicroscopy, 21 (4). 305-312 doi:10.1016/0304-3991(87)90028-3
Bradley, S.A., King, W.E. (1987) Foreword. Ultramicroscopy, 22 (1). doi:10.1016/0304-3991(87)90044-1
(1987) Colour illustrations. Ultramicroscopy, 23 (1). 1pp. doi:10.1016/0304-3991(87)90221-x
(1987) Author index to volume 22. Ultramicroscopy, 22 (1). 325-326 doi:10.1016/0304-3991(87)90076-3
(1987) Subject index to volume 22. Ultramicroscopy, 22 (1). 327-329 doi:10.1016/0304-3991(87)90077-5
Westmacott, K.H., Thorel, A., Broussaud, D., Laval, J.Y. (1987) Microstructural changes in (Mg) PSZ during aging at 1000°C. Ultramicroscopy, 22 (1). 15-26 doi:10.1016/0304-3991(87)90046-5
Gibson, J.M., McDonald, M.L., Batstone, J.L., Phillips, J.M. (1987) High-resolution electron microscopy of interfaces and surfaces. Ultramicroscopy, 22 (1). 35-46 doi:10.1016/0304-3991(87)90048-9
Kim, M.J., Carpenter, R.W. (1987) Tem specimen heating during ion beam thinning: Microstructural instability. Ultramicroscopy, 21 (4). 327-334 doi:10.1016/0304-3991(87)90031-3
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 17, 2025 13:14:43
Go to top of page