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Yamaoka, H., Tanaka, N., Tsumori, K., Nishiura, M., Kenmotsu, T., Hirouchi, T., Kisaki, M., Shinto, K., Sasao, M., Matsumoto, Y., Wada, M. (2008) Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection. Review of Scientific Instruments, 79 (2). 2pp. doi:10.1063/1.2796173

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Reference TypeJournal (article/letter/editorial)
TitleTime-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection
JournalReview of Scientific Instruments
AuthorsYamaoka, H.Author
Tanaka, N.Author
Tsumori, K.Author
Nishiura, M.Author
Kenmotsu, T.Author
Hirouchi, T.Author
Kisaki, M.Author
Shinto, K.Author
Sasao, M.Author
Matsumoto, Y.Author
Wada, M.Author
Year2008Volume79
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.2796173Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4899512Long-form Identifiermindat:1:5:4899512:0
GUID0
Full ReferenceYamaoka, H., Tanaka, N., Tsumori, K., Nishiura, M., Kenmotsu, T., Hirouchi, T., Kisaki, M., Shinto, K., Sasao, M., Matsumoto, Y., Wada, M. (2008) Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection. Review of Scientific Instruments, 79 (2). 2pp. doi:10.1063/1.2796173
Plain TextYamaoka, H., Tanaka, N., Tsumori, K., Nishiura, M., Kenmotsu, T., Hirouchi, T., Kisaki, M., Shinto, K., Sasao, M., Matsumoto, Y., Wada, M. (2008) Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection. Review of Scientific Instruments, 79 (2). 2pp. doi:10.1063/1.2796173
In(2008) Review of Scientific Instruments Vol. 79 (2) AIP Publishing

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