Tanaka, N., Kato, S., Miyamoto, T., Nishiura, M., Tsumori, K., Matsumoto, Y., Kenmotsu, T., Okamoto, A., Kitajima, S., Sasao, M., Wada, M., Yamaoka, H. (2014) Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces. Review of Scientific Instruments, 85 (2). 2pp. doi:10.1063/1.4855455
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces | ||
| Journal | Review of Scientific Instruments | ||
| Authors | Tanaka, N. | Author | |
| Kato, S. | Author | ||
| Miyamoto, T. | Author | ||
| Nishiura, M. | Author | ||
| Tsumori, K. | Author | ||
| Matsumoto, Y. | Author | ||
| Kenmotsu, T. | Author | ||
| Okamoto, A. | Author | ||
| Kitajima, S. | Author | ||
| Sasao, M. | Author | ||
| Wada, M. | Author | ||
| Yamaoka, H. | Author | ||
| Year | 2014 (February) | Volume | 85 |
| Issue | 2 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4855455Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4920504 | Long-form Identifier | mindat:1:5:4920504:2 |
| GUID | 0 | ||
| Full Reference | Tanaka, N., Kato, S., Miyamoto, T., Nishiura, M., Tsumori, K., Matsumoto, Y., Kenmotsu, T., Okamoto, A., Kitajima, S., Sasao, M., Wada, M., Yamaoka, H. (2014) Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces. Review of Scientific Instruments, 85 (2). 2pp. doi:10.1063/1.4855455 | ||
| Plain Text | Tanaka, N., Kato, S., Miyamoto, T., Nishiura, M., Tsumori, K., Matsumoto, Y., Kenmotsu, T., Okamoto, A., Kitajima, S., Sasao, M., Wada, M., Yamaoka, H. (2014) Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces. Review of Scientific Instruments, 85 (2). 2pp. doi:10.1063/1.4855455 | ||
| In | (2014, February) Review of Scientific Instruments Vol. 85 (2) AIP Publishing | ||
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