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Alexander, Leroy, Klug, Harold P. (1950) Determination of Crystallite Size with the X‐Ray Spectrometer. Journal of Applied Physics, 21 (2). 137-142 doi:10.1063/1.1699612

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of Crystallite Size with the X‐Ray Spectrometer
JournalJournal of Applied Physics
AuthorsAlexander, LeroyAuthor
Klug, Harold P.Author
Year1950 (February)Volume21
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.1699612
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Mindat Ref. ID4906703Long-form Identifiermindat:1:5:4906703:5
GUID0
Full ReferenceAlexander, Leroy, Klug, Harold P. (1950) Determination of Crystallite Size with the X‐Ray Spectrometer. Journal of Applied Physics, 21 (2). 137-142 doi:10.1063/1.1699612
Plain TextAlexander, Leroy, Klug, Harold P. (1950) Determination of Crystallite Size with the X‐Ray Spectrometer. Journal of Applied Physics, 21 (2). 137-142 doi:10.1063/1.1699612
In(1950, February) Journal of Applied Physics Vol. 21 (2) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Alexander, Leroy (1954) The Synthesis of X‐Ray Spectrometer Line Profiles with Application to Crystallite Size Measurements. Journal of Applied Physics, 25 (2). 155-161 doi:10.1063/1.1721595
Alexander, Leroy, Kummer, Elizabeth, Klug, Harold P. (1949) Dead Time and Non‐Linearity Characteristics of the Geiger‐Counter X‐Ray Spectrometer. Journal of Applied Physics, 20 (8). 735-740 doi:10.1063/1.1698521
Alexander, Leroy (1950) Geometrical Factors Affecting the Contours of X‐Ray Spectrometer Maxima. II. Factors Causing Broadening. Journal of Applied Physics, 21 (2). 126-136 doi:10.1063/1.1699611
Klug, H. P., Alexander, Leroy., Kummer, Elizabeth. (1948) Quantitative Analysis with X-Ray Spectrometer. Analytical Chemistry, 20 (7). 607-609 doi:10.1021/ac60019a003
Alexander, Leroy, Klug, Harold P., Kummer, Elizabeth (1948) Statistical Factors Affecting the Intensity of X‐Rays Diffracted by Crystalline Powders. Journal of Applied Physics, 19 (8). 742-753 doi:10.1063/1.1698200
Alexander, Leroy E., Klug, H. P. (1951) X‐ray and electron diffraction. Physics Today, 4 (1). 32-33 doi:10.1063/1.3067136
Bienenstock, Arthur (1961) Determination of Crystallite Size Distributions from X‐Ray Line Broadening. Journal of Applied Physics, 32 (2). 187-189 doi:10.1063/1.1735975
Alexander, Leroy (1950) Analysis of Intensities Obtainable Using Pinhole and Slit Collimators in X‐Ray Powder Diffraction Techniques. Journal of Applied Physics, 21 (8). 779-782 doi:10.1063/1.1699757
Alexander, Leroy (1948) Geometrical Factors Affecting the Contours of X‐Ray Spectrometer Maxima. I. Factors Causing Asymmetry. Journal of Applied Physics, 19 (11). 1068-1071 doi:10.1063/1.1698013
Martín-Palma, R. J., Pascual, L., Herrero, P., Martínez-Duart, J. M. (2005) Monte Carlo determination of crystallite size of porous silicon from x-ray line broadening. Applied Physics Letters, 87 (21). 211906pp. doi:10.1063/1.2133923
Post, Ben (1975) X-ray diffraction procedures for polycrystalline and amorphous materials. Harold P. Klug and Leroy E. Alexander, John Wiley & Sons, New York, 1974, pp. 960. $37.50. X-Ray Spectrometry, 4 (4). doi:10.1002/xrs.1300040415
 
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