Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy. Ultramicroscopy, 168. 7-16 doi:10.1016/j.ultramic.2016.05.008
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy | ||
| Journal | Ultramicroscopy | ||
| Authors | Chen, Z. | Author | |
| Weyland, M. | Author | ||
| Sang, X. | Author | ||
| Xu, W. | Author | ||
| Dycus, J.H. | Author | ||
| LeBeau, J.M. | Author | ||
| D'Alfonso, A.J. | Author | ||
| Allen, L.J. | Author | ||
| Findlay, S.D. | Author | ||
| Year | 2016 (September) | Volume | 168 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ultramic.2016.05.008Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4910307 | Long-form Identifier | mindat:1:5:4910307:2 |
| GUID | 0 | ||
| Full Reference | Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy. Ultramicroscopy, 168. 7-16 doi:10.1016/j.ultramic.2016.05.008 | ||
| Plain Text | Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy. Ultramicroscopy, 168. 7-16 doi:10.1016/j.ultramic.2016.05.008 | ||
| In | (2016) Ultramicroscopy Vol. 168. Elsevier BV | ||
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