Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. Ultramicroscopy, 169. 107-121 doi:10.1016/j.ultramic.2016.06.009
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Practical aspects of diffractive imaging using an atomic-scale coherent electron probe | ||
| Journal | Ultramicroscopy | ||
| Authors | Chen, Z. | Author | |
| Weyland, M. | Author | ||
| Ercius, P. | Author | ||
| Ciston, J. | Author | ||
| Zheng, C. | Author | ||
| Fuhrer, M.S. | Author | ||
| D'Alfonso, A.J. | Author | ||
| Allen, L.J. | Author | ||
| Findlay, S.D. | Author | ||
| Year | 2016 (October) | Volume | 169 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ultramic.2016.06.009Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4910348 | Long-form Identifier | mindat:1:5:4910348:9 |
| GUID | 0 | ||
| Full Reference | Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. Ultramicroscopy, 169. 107-121 doi:10.1016/j.ultramic.2016.06.009 | ||
| Plain Text | Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D. (2016) Practical aspects of diffractive imaging using an atomic-scale coherent electron probe. Ultramicroscopy, 169. 107-121 doi:10.1016/j.ultramic.2016.06.009 | ||
| In | (2016) Ultramicroscopy Vol. 169. Elsevier BV | ||
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