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Giannuzzi, Lucille A., Young, Richard, Carleson, Pete (1999) Using a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures. Microscopy Today, 7 (2). 12-15 doi:10.1017/s1551929500063860

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Reference TypeJournal (article/letter/editorial)
TitleUsing a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures
JournalMicroscopy Today
AuthorsGiannuzzi, Lucille A.Author
Young, RichardAuthor
Carleson, PeteAuthor
Year1999 (March)Volume7
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1551929500063860Search in ResearchGate
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Mindat Ref. ID4967141Long-form Identifiermindat:1:5:4967141:2
GUID0
Full ReferenceGiannuzzi, Lucille A., Young, Richard, Carleson, Pete (1999) Using a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures. Microscopy Today, 7 (2). 12-15 doi:10.1017/s1551929500063860
Plain TextGiannuzzi, Lucille A., Young, Richard, Carleson, Pete (1999) Using a Focused Ion Beam (FIB) System to Extract TEM-Ready Samples from Complex Metallic and Ceramic Structures. Microscopy Today, 7 (2). 12-15 doi:10.1017/s1551929500063860
In(1999, March) Microscopy Today Vol. 7 (2) Cambridge University Press (CUP)

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Giannuzzi, Lucille A. (2004) FIB Lift-Out and Milling of Cylindrical Specimens for Electron Tomography (or Atom Probe Field Ion Microscopy). Microscopy Today, 12 (6). 34-35 doi:10.1017/s1551929500065950
Leer, B Van, Giannuzzi, LA (2008) Advances in TEM Sample Preparation Using a Focused Ion Beam. Microscopy and Microanalysis, 14. 380-381 doi:10.1017/s1431927608086030
Lomness, Janice K., Giannuzzi, Lucille A., Hampton, Michael D. (2001) Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique. Microscopy and Microanalysis, 7 (5). 418-423 doi:10.1017/s1431927601010418
Vitale, Suzy, Sugar, Joshua D., Cappillino, Patrick J., Giannuzzi, Lucille A., Robinson, David B. (2016) Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam. Microscopy and Microanalysis, 22. 180-181 doi:10.1017/s1431927616001756
Giannuzzi, Lucille A., Harrison, Shay L., Williams, Kirk L., Goduguchinta, Ram K., Vaaler, Erik G., Schneiter, John L., Pegna, Joseph (2016) Manipulation of Ceramic Fibers to EXpressLOâ„¢ Grids for FIB/TEM Analysis. Microscopy and Microanalysis, 22. 134-135 doi:10.1017/s1431927616001525
Giannuzzi, Lucille A., Moldovan, Nicolaie, Trindell, Jamie A., Sugar, Joshua D. (2022) Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps. Microscopy Today, 30 (2) 24-29 doi:10.1017/s1551929522000414
Coffey, Dorothy W., More, Karren L., Brummett, Tracie (2004) TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique. Microscopy and Microanalysis, 10. 1160-1161 doi:10.1017/s1431927604886835
Giannuzzi, L A (2005) Focused Ion Beam Induced X-Ray Analysis. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605508420
Giannuzzi, L A, Giannuzzi, N J, Capuano, M J (2005) FIB, SEM, and TEM of Bone/Dental Implant Interfaces. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605508225
Schwarz, Stephen M, Giannuzzi, Lucille A (2004) FIB Specimen Preparation for STEM and EFTEM Tomography. Microscopy and Microanalysis, 10. 142-143 doi:10.1017/s143192760488752x
Saunders, M, Kong, C, Shaw, JA, Macey, DJ, Clode, PL (2009) Structural and Chemical Characterisation of the Biomineralized Teeth in Marine Molluscs using Focused Ion Beam (FIB) Processing and TEM. Microscopy and Microanalysis, 15. 902-903 doi:10.1017/s1431927609095877
 
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