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Ziegler, James F. (1972) Determination of Lattice Disorder Profiles in Crystals by Nuclear Backscattering. Journal of Applied Physics, 43 (7). 2973-2981 doi:10.1063/1.1661643

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of Lattice Disorder Profiles in Crystals by Nuclear Backscattering
JournalJournal of Applied Physics
AuthorsZiegler, James F.Author
Year1972 (July)Volume43
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1661643Search in ResearchGate
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Mindat Ref. ID4973359Long-form Identifiermindat:1:5:4973359:0
GUID0
Full ReferenceZiegler, James F. (1972) Determination of Lattice Disorder Profiles in Crystals by Nuclear Backscattering. Journal of Applied Physics, 43 (7). 2973-2981 doi:10.1063/1.1661643
Plain TextZiegler, James F. (1972) Determination of Lattice Disorder Profiles in Crystals by Nuclear Backscattering. Journal of Applied Physics, 43 (7). 2973-2981 doi:10.1063/1.1661643
In(1972, July) Journal of Applied Physics Vol. 43 (7) AIP Publishing

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Ziegler, James F., Baglin, John E. E. (1971) Determination of Surface Impurity Concentration Profiles by Nuclear Backscattering. Journal of Applied Physics, 42 (5). 2031-2040 doi:10.1063/1.1660483
Brodsky, M.H., Kaplan, D., Ziegler, J.F. (1972) Densities of amorphous Si films by nuclear backscattering. Applied Physics Letters, 21 (7). 305-307 doi:10.1063/1.1654388
Ziegler, J. F., Crowder, B. L. (1972) Defining the ``Random'' Spectrum as Used in the Channeling Technique of Nuclear Backscattering. Applied Physics Letters, 20 (4). 178-179 doi:10.1063/1.1654099
Ziegler, J. F., Cole, G. W., Baglin, J. E. E. (1972) Technique for determining concentration profiles of boron impurities in substrates. Journal of Applied Physics, 43 (9). 3809-3815 doi:10.1063/1.1661816
Young, F. W., Sherrill, F. A. (1972) Burgers Vector of Dislocations Generated by Small Stresses in Copper Crystals. Journal of Applied Physics, 43 (7). 2949-2950 doi:10.1063/1.1661637
Mendelson, S. (1972) Dislocation Dissociations and Dislocation Mobility in Diamond Lattice Crystals. Journal of Applied Physics, 43 (5). 2102-2113 doi:10.1063/1.1661460
Mayer, J. W., Ziegler, J. F., Chang, L. L., Tsu, R., Esaki, L. (1973) Profiling of periodic structures (GaAs–GaAlAs) by nuclear backscattering. Journal of Applied Physics, 44 (5). 2322-2325 doi:10.1063/1.1662558
Ziegler, J.P., Crowder, B.L. (1973) Erratum: Defining the ``random'' spectrum as used in the channeling technique of nuclear backscattering. Applied Physics Letters, 22 (7). 347 doi:10.1063/1.1654666
Maugis, D., Andarelli, G. (1972) Determination of the surface energy of naphthalene crystals by cleavage method. Journal of Applied Physics, 43 (10). 4258 doi:10.1063/1.1660906
Verbeek, H. (1975) Total backscattering yields of 3–15‐keV protons from polycrystalline Nb. Journal of Applied Physics, 46 (7). 2981-2985 doi:10.1063/1.322038
Feldman, L. C., Rodgers, J. W. (1970) Depth Profiles of the Lattice Disorder Resulting from Ion Bombardment of Silicon Single Crystals. Journal of Applied Physics, 41 (9). 3776-3782 doi:10.1063/1.1659506
 
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