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Ziegler, J.P., Crowder, B.L. (1973) Erratum: Defining the ``random'' spectrum as used in the channeling technique of nuclear backscattering. Applied Physics Letters, 22 (7). 347 doi:10.1063/1.1654666

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Reference TypeJournal (article/letter/editorial)
TitleErratum: Defining the ``random'' spectrum as used in the channeling technique of nuclear backscattering
JournalApplied Physics Letters
AuthorsZiegler, J.P.Author
Crowder, B.L.Author
Year1973 (April)Volume22
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1654666Search in ResearchGate
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Mindat Ref. ID8457458Long-form Identifiermindat:1:5:8457458:1
GUID0
Full ReferenceZiegler, J.P., Crowder, B.L. (1973) Erratum: Defining the ``random'' spectrum as used in the channeling technique of nuclear backscattering. Applied Physics Letters, 22 (7). 347 doi:10.1063/1.1654666
Plain TextZiegler, J.P., Crowder, B.L. (1973) Erratum: Defining the ``random'' spectrum as used in the channeling technique of nuclear backscattering. Applied Physics Letters, 22 (7). 347 doi:10.1063/1.1654666
In(1973, April) Applied Physics Letters Vol. 22 (7) AIP Publishing

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Ziegler, J. F., Crowder, B. L. (1972) Defining the ``Random'' Spectrum as Used in the Channeling Technique of Nuclear Backscattering. Applied Physics Letters, 20 (4). 178-179 doi:10.1063/1.1654099
Chu, W.K., Crowder, B.L., Mayer, J.W., Ziegler, J.F. (1973) Range distribution of implanted ions in SiO2, Si3N4, and Al2O3. Applied Physics Letters, 22 (10). 490-492 doi:10.1063/1.1654480
Tu, K.N., Tan, S.I., Crowder, B.L. (1973) Circular etch pits in ionā€implanted amorphous silicon films. Applied Physics Letters, 22 (6). 274-275 doi:10.1063/1.1654636
Ziegler, J.F., Crowder, B.L., Cole, G.W., Baglin, J.E.E., Masters, B.J. (1972) Boron atom distributions in ionā€implanted silicon by the (n,4He) nuclear reaction. Applied Physics Letters, 21 (1). 16-17 doi:10.1063/1.1654197
Fahrner, W., Goetzberger, A. (1973) Erratum: Determination of deep energy levels in Si by MOS techniques. Applied Physics Letters, 22 (7). 347 doi:10.1063/1.1654667
Dygo, A., Lennard, W.N., Mitchell, I.V., Smulders, P.J.M. (1994) Random spectrum for the channeling-backscattering technique: A rotating axial-dip study. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 84 (1). 23-30 doi:10.1016/0168-583x(94)95698-7
Brodsky, M.H., Kaplan, D., Ziegler, J.F. (1972) Densities of amorphous Si films by nuclear backscattering. Applied Physics Letters, 21 (7). 305-307 doi:10.1063/1.1654388
Ziegler, James F. (1972) Determination of Lattice Disorder Profiles in Crystals by Nuclear Backscattering. Journal of Applied Physics, 43 (7). 2973-2981 doi:10.1063/1.1661643
Evenson, K.M., Wells, J.S., Petersen, F.R., Danielson, B.L., Day, G.W. (1973) Accurate frequencies of molecular transitions used in laser stabilization: the 3.39ā€Ī¼m transition in CH4 and the 9.33ā€ and 10.18ā€Ī¼m transitions in CO2. Applied Physics Letters, 22 (4). 192-195 doi:10.1063/1.1654607
Shao, Lin, Nastasi, Michael (2005) Methods for the accurate analysis of channeling Rutherford backscattering spectrometry. Applied Physics Letters, 87 (6). 64103pp. doi:10.1063/1.2007861
Kido, Yoshiaki, Kawamoto, Junichi (1987) Versatile computer programs for analysis of random and channeling backscattering spectra. Journal of Applied Physics, 61 (3). 956-961 doi:10.1063/1.338148
 
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