Reference Type | Journal (article/letter/editorial) |
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Title | Electron microscope studies of a Ge–GaAs superlattice grown by molecular beam epitaxy |
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Journal | Journal of Applied Physics |
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Authors | Kuan, T. S. | Author |
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Chang, C.‐A. | Author |
Year | 1983 (August) | Volume | 54 |
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Issue | 8 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.332688Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5018129 | Long-form Identifier | mindat:1:5:5018129:8 |
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GUID | 0 |
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Full Reference | Kuan, T. S., Chang, C.‐A. (1983) Electron microscope studies of a Ge–GaAs superlattice grown by molecular beam epitaxy. Journal of Applied Physics, 54 (8). 4408-4413 doi:10.1063/1.332688 |
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Plain Text | Kuan, T. S., Chang, C.‐A. (1983) Electron microscope studies of a Ge–GaAs superlattice grown by molecular beam epitaxy. Journal of Applied Physics, 54 (8). 4408-4413 doi:10.1063/1.332688 |
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In | (1983, August) Journal of Applied Physics Vol. 54 (8) AIP Publishing |
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