Reference Type | Journal (article/letter/editorial) |
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Title | Transmission electron microscopy studies of GaAs nanostructures in InGaAs∕InP matrix grown by molecular beam epitaxy |
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Journal | Journal of Applied Physics |
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Authors | Lin, S. D. | Author |
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Lin, Z. C. | Author |
Lee, C. P. | Author |
Year | 2006 (September) | Volume | 100 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2345031Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5143790 | Long-form Identifier | mindat:1:5:5143790:9 |
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GUID | 0 |
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Full Reference | Lin, S. D., Lin, Z. C., Lee, C. P. (2006) Transmission electron microscopy studies of GaAs nanostructures in InGaAs∕InP matrix grown by molecular beam epitaxy. Journal of Applied Physics, 100 (5). 54312pp. doi:10.1063/1.2345031 |
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Plain Text | Lin, S. D., Lin, Z. C., Lee, C. P. (2006) Transmission electron microscopy studies of GaAs nanostructures in InGaAs∕InP matrix grown by molecular beam epitaxy. Journal of Applied Physics, 100 (5). 54312pp. doi:10.1063/1.2345031 |
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In | (2006, September) Journal of Applied Physics Vol. 100 (5) AIP Publishing |
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