Reference Type | Journal (article/letter/editorial) |
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Title | High‐resolution measurements of localized vibrational mode infrared absorption of Si‐doped GaAs |
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Journal | Journal of Applied Physics |
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Authors | Theis, W. M. | Author |
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Spitzer, W. G. | Author |
Year | 1984 (August 15) | Volume | 56 |
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Issue | 4 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.334064Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5020976 | Long-form Identifier | mindat:1:5:5020976:1 |
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GUID | 0 |
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Full Reference | Theis, W. M., Spitzer, W. G. (1984) High‐resolution measurements of localized vibrational mode infrared absorption of Si‐doped GaAs. Journal of Applied Physics, 56 (4). 890-898 doi:10.1063/1.334064 |
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Plain Text | Theis, W. M., Spitzer, W. G. (1984) High‐resolution measurements of localized vibrational mode infrared absorption of Si‐doped GaAs. Journal of Applied Physics, 56 (4). 890-898 doi:10.1063/1.334064 |
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In | (1984, August) Journal of Applied Physics Vol. 56 (4) AIP Publishing |
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