Reference Type | Journal (article/letter/editorial) |
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Title | Misfit stress relaxation mechanism in CdTe(100) and CdTe/ZnTe(100) on a GaAs(100) highly mismatched heteroepitaxial layer |
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Journal | Journal of Applied Physics |
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Authors | Nishino, H. | Author |
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Sugiyama, I. | Author |
Nishijima, Y. | Author |
Year | 1996 (September 15) | Volume | 80 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.363265Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5082912 | Long-form Identifier | mindat:1:5:5082912:1 |
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GUID | 0 |
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Full Reference | Nishino, H., Sugiyama, I., Nishijima, Y. (1996) Misfit stress relaxation mechanism in CdTe(100) and CdTe/ZnTe(100) on a GaAs(100) highly mismatched heteroepitaxial layer. Journal of Applied Physics, 80 (6). 3238-3243 doi:10.1063/1.363265 |
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Plain Text | Nishino, H., Sugiyama, I., Nishijima, Y. (1996) Misfit stress relaxation mechanism in CdTe(100) and CdTe/ZnTe(100) on a GaAs(100) highly mismatched heteroepitaxial layer. Journal of Applied Physics, 80 (6). 3238-3243 doi:10.1063/1.363265 |
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In | (1996, September) Journal of Applied Physics Vol. 80 (6) AIP Publishing |
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