Reference Type | Journal (article/letter/editorial) |
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Title | Analysis of abnormal x-ray diffraction peak broadening from InGaAs/GaAs multiple quantum wells |
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Journal | Journal of Applied Physics |
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Authors | Kim, In | Author |
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Choe, Byung-Doo | Author |
Park, Sang Koo | Author |
Jeong, Weon Guk | Author |
Year | 1997 (November 15) | Volume | 82 |
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Issue | 10 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.366348Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5087299 | Long-form Identifier | mindat:1:5:5087299:2 |
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GUID | 0 |
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Full Reference | Kim, In, Choe, Byung-Doo, Park, Sang Koo, Jeong, Weon Guk (1997) Analysis of abnormal x-ray diffraction peak broadening from InGaAs/GaAs multiple quantum wells. Journal of Applied Physics, 82 (10). 4865-4869 doi:10.1063/1.366348 |
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Plain Text | Kim, In, Choe, Byung-Doo, Park, Sang Koo, Jeong, Weon Guk (1997) Analysis of abnormal x-ray diffraction peak broadening from InGaAs/GaAs multiple quantum wells. Journal of Applied Physics, 82 (10). 4865-4869 doi:10.1063/1.366348 |
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In | (1997, November) Journal of Applied Physics Vol. 82 (10) AIP Publishing |
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