Heremans, P., Kuijk, M., Windisch, R., Vanderhaegen, J., De Neve, H., Vounckx, R., Borghs, G. (1997) Angular spectroscopic analysis: An optical characterization technique for laterally oxidized AlGaAs layers. Journal of Applied Physics, 82 (10). 5265-5267 doi:10.1063/1.366395
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Angular spectroscopic analysis: An optical characterization technique for laterally oxidized AlGaAs layers | ||
Journal | Journal of Applied Physics | ||
Authors | Heremans, P. | Author | |
Kuijk, M. | Author | ||
Windisch, R. | Author | ||
Vanderhaegen, J. | Author | ||
De Neve, H. | Author | ||
Vounckx, R. | Author | ||
Borghs, G. | Author | ||
Year | 1997 (November 15) | Volume | 82 |
Issue | 10 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.366395Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5087393 | Long-form Identifier | mindat:1:5:5087393:7 |
GUID | 0 | ||
Full Reference | Heremans, P., Kuijk, M., Windisch, R., Vanderhaegen, J., De Neve, H., Vounckx, R., Borghs, G. (1997) Angular spectroscopic analysis: An optical characterization technique for laterally oxidized AlGaAs layers. Journal of Applied Physics, 82 (10). 5265-5267 doi:10.1063/1.366395 | ||
Plain Text | Heremans, P., Kuijk, M., Windisch, R., Vanderhaegen, J., De Neve, H., Vounckx, R., Borghs, G. (1997) Angular spectroscopic analysis: An optical characterization technique for laterally oxidized AlGaAs layers. Journal of Applied Physics, 82 (10). 5265-5267 doi:10.1063/1.366395 | ||
In | (1997, November) Journal of Applied Physics Vol. 82 (10) AIP Publishing |
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