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Maruno, S., Fujita, S., Watanabe, H., Ichikawa, M. (1997) Observation of selective thermal desorption of electron stimulated SiO2 with a combined scanning reflection electron microscope/scanning tunneling microscope. Journal of Applied Physics, 82 (2). 639-643 doi:10.1063/1.365592

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Reference TypeJournal (article/letter/editorial)
TitleObservation of selective thermal desorption of electron stimulated SiO2 with a combined scanning reflection electron microscope/scanning tunneling microscope
JournalJournal of Applied Physics
AuthorsMaruno, S.Author
Fujita, S.Author
Watanabe, H.Author
Ichikawa, M.Author
Year1997 (July 15)Volume82
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.365592Search in ResearchGate
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Mindat Ref. ID5087771Long-form Identifiermindat:1:5:5087771:1
GUID0
Full ReferenceMaruno, S., Fujita, S., Watanabe, H., Ichikawa, M. (1997) Observation of selective thermal desorption of electron stimulated SiO2 with a combined scanning reflection electron microscope/scanning tunneling microscope. Journal of Applied Physics, 82 (2). 639-643 doi:10.1063/1.365592
Plain TextMaruno, S., Fujita, S., Watanabe, H., Ichikawa, M. (1997) Observation of selective thermal desorption of electron stimulated SiO2 with a combined scanning reflection electron microscope/scanning tunneling microscope. Journal of Applied Physics, 82 (2). 639-643 doi:10.1063/1.365592
In(1997, July) Journal of Applied Physics Vol. 82 (2) AIP Publishing

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Mochiji, Kozo, Ichikawa, Masakazu (1999) Electron-Stimulated Desorption of a Br-Chemisorbed Si(111)-7 Γ— 7 Surface by Using a Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 38. doi:10.1143/jjap.38.l1391
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