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Gehanno, V., Revenant-Brizard, C., Marty, A., Gilles, B. (1998) Studies of epitaxial Fe0.5Pd0.5 thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy. Journal of Applied Physics, 84 (4). 2316-2323 doi:10.1063/1.368298

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Reference TypeJournal (article/letter/editorial)
TitleStudies of epitaxial Fe0.5Pd0.5 thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy
JournalJournal of Applied Physics
AuthorsGehanno, V.Author
Revenant-Brizard, C.Author
Marty, A.Author
Gilles, B.Author
Year1998 (August 15)Volume84
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.368298Search in ResearchGate
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Mindat Ref. ID5093106Long-form Identifiermindat:1:5:5093106:4
GUID0
Full ReferenceGehanno, V., Revenant-Brizard, C., Marty, A., Gilles, B. (1998) Studies of epitaxial Fe0.5Pd0.5 thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy. Journal of Applied Physics, 84 (4). 2316-2323 doi:10.1063/1.368298
Plain TextGehanno, V., Revenant-Brizard, C., Marty, A., Gilles, B. (1998) Studies of epitaxial Fe0.5Pd0.5 thin films by x-ray diffraction and polarized fluorescence absorption spectroscopy. Journal of Applied Physics, 84 (4). 2316-2323 doi:10.1063/1.368298
In(1998, August) Journal of Applied Physics Vol. 84 (4) AIP Publishing

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Gehanno, V., Auric, P., Marty, A., Gilles, B. (1998) Structural and magnetic properties of epitaxial Fe0.5Pd0.5 thin films studied by Mössbauer spectroscopy. Journal of Magnetism and Magnetic Materials, 188. 310-318 doi:10.1016/s0304-8853(98)00195-4
Samson, Y., Marty, A., Hoffmann, R., Gehanno, V., Gilles, B. (1999) Magnetic domains in thin films with perpendicular anisotropy: An extensive study. Journal of Applied Physics, 85 (8). 4604-4606 doi:10.1063/1.370422
Brizard, C., Regnard, J.R., Gilles, B., Marty, A. (1995) Polarized fluorescence EXAFS studies of monocrystalline Au/Ni multilayers. Physica B: Condensed Matter, 208. 411-412 doi:10.1016/0921-4526(94)00713-6
Gehanno, V., Marty, A., Gilles, B., Samson, Y. (1997) Magnetic domains in epitaxial ordered FePd(001) thin films with perpendicular magnetic anisotropy. Physical Review B, 55 (18) 12552-12555 doi:10.1103/physrevb.55.12552
Revenant‐Brizard, C., Regnard, J. R., Solmi, S., Armigliato, A., Valmorri, S., Cellini, C., Romanato, F. (1996) High‐temperature annealings of Sb and Sb/B heavily implanted silicon wafers studied by near grazing incidence fluorescence extended x‐ray absorption fine structure. Journal of Applied Physics, 79 (12). 9037-9042 doi:10.1063/1.362636
BenYoussef, J, Le Gall, H, Vukadinovic, N, Gehanno, V, Marty, A, Samson, Y, Gilles, B (1999) Ferromagnetic resonance in epitaxial FePd thin films with perpendicular anisotropy. Journal of Magnetism and Magnetic Materials, 202. 277-284 doi:10.1016/s0304-8853(99)00413-8
Kuzmin, A., Purans, J., Cazzanelli, E., Vinegoni, C., Mariotto, G. (1998) X-ray diffraction, extended x-ray absorption fine structure and Raman spectroscopy studies of WO3 powders and (1−x)WO3−y⋅xReO2 mixtures. Journal of Applied Physics, 84 (10). 5515-5524 doi:10.1063/1.368596
Valencia, S., Gaupp, A., Gudat, W., Abad, Ll., Balcells, Ll., MartĂ­nez, B., Laukhin, V. (2006) Soft x-ray absorption spectroscopy of strained epitaxial manganite thin films. Applied Physics Letters, 89 (17). 172512pp. doi:10.1063/1.2370241
Revenant-Brizard, C., Simon, J. P., Regnard, J. R., Manzini, I., Rodmacq, B. (1998) Structural Evolution of Ag–Co and Ag–Ni Alloys Studied by Anomalous Small-Angle X-ray Scattering. Journal of Applied Crystallography, 31 (5). 783-788 doi:10.1107/s0021889898005640
Gehanno, V., Samson, Y., Marty, A., Gilles, B., Chamberod, A. (1997) Magnetic susceptibility and magnetic domain configuration as a function of the layer thickness in epitaxial FePd(0 0 1) thin films ordered in the L1o structure. Journal of Magnetism and Magnetic Materials, 172. 26-40 doi:10.1016/s0304-8853(97)00089-9
Itoh, Nobuo (1993) X‐ray diffraction method for characterization of thin surface layers and thin epitaxial films. Applied Physics Letters, 62 (7). 690-692 doi:10.1063/1.108841
 
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