Reference Type | Journal (article/letter/editorial) |
---|
Title | Influence of electrical stress voltage on cathode degradation of organic light-emitting devices |
---|
Journal | Journal of Applied Physics |
---|
Authors | Lin, Karen Ke | Author |
---|
Chua, Soo Jin | Author |
Wei-Wang, | Author |
Lim, Shuang Fang | Author |
Year | 2001 (July 15) | Volume | 90 |
---|
Issue | 2 |
---|
Publisher | AIP Publishing |
---|
DOI | doi:10.1063/1.1376669Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 5109675 | Long-form Identifier | mindat:1:5:5109675:7 |
---|
|
GUID | 0 |
---|
Full Reference | Lin, Karen Ke, Chua, Soo Jin, Wei-Wang, , Lim, Shuang Fang (2001) Influence of electrical stress voltage on cathode degradation of organic light-emitting devices. Journal of Applied Physics, 90 (2). 976-979 doi:10.1063/1.1376669 |
---|
Plain Text | Lin, Karen Ke, Chua, Soo Jin, Wei-Wang, , Lim, Shuang Fang (2001) Influence of electrical stress voltage on cathode degradation of organic light-emitting devices. Journal of Applied Physics, 90 (2). 976-979 doi:10.1063/1.1376669 |
---|
In | (2001, July) Journal of Applied Physics Vol. 90 (2) AIP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.