Reference Type | Journal (article/letter/editorial) |
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Title | Correlation analysis of electrical and optical low frequency fluctuation in organic device degradation |
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Journal | Journal of Applied Physics |
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Authors | Lin, Ke | Author |
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Cheng, Lai Szu | Author |
Ramam, Adelia | Author |
Jin, Chua Soo | Author |
Year | 2009 (March 15) | Volume | 105 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3086625Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5164208 | Long-form Identifier | mindat:1:5:5164208:8 |
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GUID | 0 |
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Full Reference | Lin, Ke, Cheng, Lai Szu, Ramam, Adelia, Jin, Chua Soo (2009) Correlation analysis of electrical and optical low frequency fluctuation in organic device degradation. Journal of Applied Physics, 105 (6). 64504pp. doi:10.1063/1.3086625 |
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Plain Text | Lin, Ke, Cheng, Lai Szu, Ramam, Adelia, Jin, Chua Soo (2009) Correlation analysis of electrical and optical low frequency fluctuation in organic device degradation. Journal of Applied Physics, 105 (6). 64504pp. doi:10.1063/1.3086625 |
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In | (2009, March) Journal of Applied Physics Vol. 105 (6) AIP Publishing |
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