| Reference Type | Journal (article/letter/editorial) |
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| Title | Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current |
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| Journal | Journal of Applied Physics |
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| Authors | Matsuura, Hideharu | Author |
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| Hase, Takashi | Author |
| Sekimoto, Yasuhiro | Author |
| Uchikura, Masaharu | Author |
| Simizu, Masaru | Author |
| Year | 2002 (February 15) | Volume | 91 |
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| Issue | 4 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.1429768Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 5113608 | Long-form Identifier | mindat:1:5:5113608:2 |
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| GUID | 0 |
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| Full Reference | Matsuura, Hideharu, Hase, Takashi, Sekimoto, Yasuhiro, Uchikura, Masaharu, Simizu, Masaru (2002) Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current. Journal of Applied Physics, 91 (4). 2085-2092 doi:10.1063/1.1429768 |
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| Plain Text | Matsuura, Hideharu, Hase, Takashi, Sekimoto, Yasuhiro, Uchikura, Masaharu, Simizu, Masaru (2002) Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current. Journal of Applied Physics, 91 (4). 2085-2092 doi:10.1063/1.1429768 |
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| In | (2002, February) Journal of Applied Physics Vol. 91 (4) AIP Publishing |
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