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Chen, Z. Y., Zhao, J. P., Yano, T., Ooie, T. (2002) Valence band electronic structure of carbon nitride from x-ray photoelectron spectroscopy. Journal of Applied Physics, 92 (1). 281-287 doi:10.1063/1.1480481

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Reference TypeJournal (article/letter/editorial)
TitleValence band electronic structure of carbon nitride from x-ray photoelectron spectroscopy
JournalJournal of Applied Physics
AuthorsChen, Z. Y.Author
Zhao, J. P.Author
Yano, T.Author
Ooie, T.Author
Year2002 (July)Volume92
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.1480481Search in ResearchGate
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Mindat Ref. ID5115001Long-form Identifiermindat:1:5:5115001:9
GUID0
Full ReferenceChen, Z. Y., Zhao, J. P., Yano, T., Ooie, T. (2002) Valence band electronic structure of carbon nitride from x-ray photoelectron spectroscopy. Journal of Applied Physics, 92 (1). 281-287 doi:10.1063/1.1480481
Plain TextChen, Z. Y., Zhao, J. P., Yano, T., Ooie, T. (2002) Valence band electronic structure of carbon nitride from x-ray photoelectron spectroscopy. Journal of Applied Physics, 92 (1). 281-287 doi:10.1063/1.1480481
In(2002, July) Journal of Applied Physics Vol. 92 (1) AIP Publishing

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