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Green, Daniel S., Vembu, Bharath, Hepper, David, Gibb, Shawn R., Jin, Daniel, Vetury, Rama, Shealy, Jeffrey B., Beechem, L. Thomas, Graham, Samuel (2008) GaN HEMT thermal behavior and implications for reliability testing and analysis. physica status solidi (c), 5 (6). 2026-2029 doi:10.1002/pssc.200778722

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Reference TypeJournal (article/letter/editorial)
TitleGaN HEMT thermal behavior and implications for reliability testing and analysis
Journalphysica status solidi (c)
AuthorsGreen, Daniel S.Author
Vembu, BharathAuthor
Hepper, DavidAuthor
Gibb, Shawn R.Author
Jin, DanielAuthor
Vetury, RamaAuthor
Shealy, Jeffrey B.Author
Beechem, L. ThomasAuthor
Graham, SamuelAuthor
Year2008 (May)Volume5
Issue6
PublisherWiley
DOIdoi:10.1002/pssc.200778722Search in ResearchGate
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Mindat Ref. ID5116504Long-form Identifiermindat:1:5:5116504:8
GUID0
Full ReferenceGreen, Daniel S., Vembu, Bharath, Hepper, David, Gibb, Shawn R., Jin, Daniel, Vetury, Rama, Shealy, Jeffrey B., Beechem, L. Thomas, Graham, Samuel (2008) GaN HEMT thermal behavior and implications for reliability testing and analysis. physica status solidi (c), 5 (6). 2026-2029 doi:10.1002/pssc.200778722
Plain TextGreen, Daniel S., Vembu, Bharath, Hepper, David, Gibb, Shawn R., Jin, Daniel, Vetury, Rama, Shealy, Jeffrey B., Beechem, L. Thomas, Graham, Samuel (2008) GaN HEMT thermal behavior and implications for reliability testing and analysis. physica status solidi (c), 5 (6). 2026-2029 doi:10.1002/pssc.200778722
In(2008, May) physica status solidi (c) Vol. 5 (6) Wiley

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Chen, H., Lai, Z., Kung, S., Penner, R., Li, G. P. (2008) Electroluminescence characteristics of GaN HEMT at off-state. physica status solidi (c), 5 (6). 1895-1897 doi:10.1002/pssc.200778494
Green, D.S., Gibb, S.R., Hosse, B., Vetury, R., Grider, D.E., Smart, J.A. (2004) Control of epitaxial defects for optimal AlGaN/GaN HEMT performance and reliability. Journal of Crystal Growth, 272 (1). 285-292 doi:10.1016/j.jcrysgro.2004.08.129
Danylyuk, S. V., Vitusevich, S. A., Kaper, V., Tilak, V., Klein, N., Eastman, L. F., Shealy, J. R. (2005) Phase noise study of AlGaN/GaN HEMT X-band oscillator. physica status solidi (c), 2 (7). 2615-2618 doi:10.1002/pssc.200461457
Brannick, A., Zakhleniuk, N., Ridley, B. K., Eastman, L. F., Schaff, W. J., Shealy, J. R. (2007) Advanced modelling of GaN/AlGaN HEMT devices with field plate. physica status solidi (c), 4 (2). 651-654 doi:10.1002/pssc.200673349
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