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Li, X. D., Chen, T. P., Liu, P., Liu, Y., Liu, Z., Leong, K. C. (2014) A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness. Journal of Applied Physics, 115 (10). 103512pp. doi:10.1063/1.4868338

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Reference TypeJournal (article/letter/editorial)
TitleA study on the evolution of dielectric function of ZnO thin films with decreasing film thickness
JournalJournal of Applied Physics
AuthorsLi, X. D.Author
Chen, T. P.Author
Liu, P.Author
Liu, Y.Author
Liu, Z.Author
Leong, K. C.Author
Year2014 (March 14)Volume115
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.4868338Search in ResearchGate
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Mindat Ref. ID5196196Long-form Identifiermindat:1:5:5196196:5
GUID0
Full ReferenceLi, X. D., Chen, T. P., Liu, P., Liu, Y., Liu, Z., Leong, K. C. (2014) A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness. Journal of Applied Physics, 115 (10). 103512pp. doi:10.1063/1.4868338
Plain TextLi, X. D., Chen, T. P., Liu, P., Liu, Y., Liu, Z., Leong, K. C. (2014) A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness. Journal of Applied Physics, 115 (10). 103512pp. doi:10.1063/1.4868338
In(2014, March) Journal of Applied Physics Vol. 115 (10) AIP Publishing

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