Liu, P., Chen, T. P., Li, X. D., Liu, Z., Wong, J. I., Liu, Y., Leong, K. C. (2013) Recovery from ultraviolet-induced threshold voltage shift in indium gallium zinc oxide thin film transistors by positive gate bias. Applied Physics Letters, 103 (20). 202110pp. doi:10.1063/1.4830368
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Recovery from ultraviolet-induced threshold voltage shift in indium gallium zinc oxide thin film transistors by positive gate bias | ||
| Journal | Applied Physics Letters | ||
| Authors | Liu, P. | Author | |
| Chen, T. P. | Author | ||
| Li, X. D. | Author | ||
| Liu, Z. | Author | ||
| Wong, J. I. | Author | ||
| Liu, Y. | Author | ||
| Leong, K. C. | Author | ||
| Year | 2013 (November 11) | Volume | 103 |
| Issue | 20 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4830368Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8618423 | Long-form Identifier | mindat:1:5:8618423:0 |
| GUID | 0 | ||
| Full Reference | Liu, P., Chen, T. P., Li, X. D., Liu, Z., Wong, J. I., Liu, Y., Leong, K. C. (2013) Recovery from ultraviolet-induced threshold voltage shift in indium gallium zinc oxide thin film transistors by positive gate bias. Applied Physics Letters, 103 (20). 202110pp. doi:10.1063/1.4830368 | ||
| Plain Text | Liu, P., Chen, T. P., Li, X. D., Liu, Z., Wong, J. I., Liu, Y., Leong, K. C. (2013) Recovery from ultraviolet-induced threshold voltage shift in indium gallium zinc oxide thin film transistors by positive gate bias. Applied Physics Letters, 103 (20). 202110pp. doi:10.1063/1.4830368 | ||
| In | (2013, November) Applied Physics Letters Vol. 103 (20) AIP Publishing | ||
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