Sagdeo, Archna, Nagwanshi, Anjali, Pokhriyal, Preeti, Sinha, A. K., Rajput, Parasmani, Mishra, Vikash, Sagdeo, P. R. (2018) Disappearance of dielectric anomaly in spite of presence of structural phase transition in reduced BaTiO3: Effect of defect states within the bandgap. Journal of Applied Physics, 123 (16). 161424pp. doi:10.1063/1.5010870
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Disappearance of dielectric anomaly in spite of presence of structural phase transition in reduced BaTiO3: Effect of defect states within the bandgap | ||
| Journal | Journal of Applied Physics | ||
| Authors | Sagdeo, Archna | Author | |
| Nagwanshi, Anjali | Author | ||
| Pokhriyal, Preeti | Author | ||
| Sinha, A. K. | Author | ||
| Rajput, Parasmani | Author | ||
| Mishra, Vikash | Author | ||
| Sagdeo, P. R. | Author | ||
| Year | 2018 (April 28) | Volume | 123 |
| Issue | 16 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.5010870Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5208857 | Long-form Identifier | mindat:1:5:5208857:9 |
| GUID | 0 | ||
| Full Reference | Sagdeo, Archna, Nagwanshi, Anjali, Pokhriyal, Preeti, Sinha, A. K., Rajput, Parasmani, Mishra, Vikash, Sagdeo, P. R. (2018) Disappearance of dielectric anomaly in spite of presence of structural phase transition in reduced BaTiO3: Effect of defect states within the bandgap. Journal of Applied Physics, 123 (16). 161424pp. doi:10.1063/1.5010870 | ||
| Plain Text | Sagdeo, Archna, Nagwanshi, Anjali, Pokhriyal, Preeti, Sinha, A. K., Rajput, Parasmani, Mishra, Vikash, Sagdeo, P. R. (2018) Disappearance of dielectric anomaly in spite of presence of structural phase transition in reduced BaTiO3: Effect of defect states within the bandgap. Journal of Applied Physics, 123 (16). 161424pp. doi:10.1063/1.5010870 | ||
| In | (2018, April) Journal of Applied Physics Vol. 123 (16) AIP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
