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Nowak, Stanisław H., Reinhardt, Falk, Beckhoff, Burkhard, Dousse, Jean-Claude, Szlachetko, Jakub (2013) Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects. Journal of Analytical Atomic Spectrometry, 28 (5). 689pp. doi:10.1039/c3ja30338a

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Reference TypeJournal (article/letter/editorial)
TitleGeometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects
JournalJournal of Analytical Atomic Spectrometry
AuthorsNowak, Stanisław H.Author
Reinhardt, FalkAuthor
Beckhoff, BurkhardAuthor
Dousse, Jean-ClaudeAuthor
Szlachetko, JakubAuthor
Year2013Volume28
Issue5
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c3ja30338aSearch in ResearchGate
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Mindat Ref. ID5342285Long-form Identifiermindat:1:5:5342285:9
GUID0
Full ReferenceNowak, Stanisław H., Reinhardt, Falk, Beckhoff, Burkhard, Dousse, Jean-Claude, Szlachetko, Jakub (2013) Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects. Journal of Analytical Atomic Spectrometry, 28 (5). 689pp. doi:10.1039/c3ja30338a
Plain TextNowak, Stanisław H., Reinhardt, Falk, Beckhoff, Burkhard, Dousse, Jean-Claude, Szlachetko, Jakub (2013) Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects. Journal of Analytical Atomic Spectrometry, 28 (5). 689pp. doi:10.1039/c3ja30338a
In(2013) Journal of Analytical Atomic Spectrometry Vol. 28 (5) Royal Society of Chemistry (RSC)

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Nowak, Stanisław H., Beckhoff, Burkhard, Reinhardt, Falk, Dousse, Jean-Claude (2015) Reply to the Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations”. Journal of Analytical Atomic Spectrometry, 30 (12). 2551-2553 doi:10.1039/c5ja00244c
Reinhardt, Falk, Nowak, Stanisław H., Beckhoff, Burkhard, Dousse, Jean-Claude, Schoengen, Max (2014) Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations. J. Anal. At. Spectrom., 29 (10). 1778-1784 doi:10.1039/c4ja00164h
Jark, W., Eichert, D. (2015) Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778. Journal of Analytical Atomic Spectrometry, 30 (12). 2548-2550 doi:10.1039/c5ja00040h
Kayser, Yves, Hönicke, Philipp, Banaś, Dariusz, Dousse, Jean-Claude, Hoszowska, Joanna, Jagodziński, Paweł, Kubala-Kukuś, Aldona, Nowak, Stanisław H., Pajek, Marek (2015) Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence. Journal of Analytical Atomic Spectrometry, 30 (5). 1086-1099 doi:10.1039/c4ja00461b
Hönicke, P., Kayser, Y., Beckhoff, B., Müller, M., Dousse, J.-Cl., Hoszowska, J., Nowak, S. H. (2012) Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy. Journal of Analytical Atomic Spectrometry, 27 (9). 1432pp. doi:10.1039/c2ja10385k
Reinhardt, Falk, Osán, János, Török, Szabina, Pap, Andrea Edit, Kolbe, Michael, Beckhoff, Burkhard (2012) Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis. J. Anal. At. Spectrom., 27 (2). 248-255 doi:10.1039/c2ja10286b
Pollakowski, Beatrix, Beckhoff, Burkhard, Reinhardt, Falk, Braun, Stefan, Gawlitza, Peter (2008) Speciation of deeply buriedTiOxnanolayers with grazing-incidence x-ray fluorescence combined with a near-edge x-ray absorption fine-structure investigation. Physical Review B, 77 (23) doi:10.1103/physrevb.77.235408
Szlachetko, Monika, Hoszowska, Joanna, Szlachetko, Jakub, Dousse, Jean-Claude (2019) Novel reference-free methods for the determination of the instrumental response of Laue-type bent crystal spectrometers. Journal of Analytical Atomic Spectrometry, 34 (11). 2325-2332 doi:10.1039/c9ja00251k
Unterumsberger, Rainer, Pollakowski, Beatrix, Müller, Matthias, Beckhoff, Burkhard (2011) Complementary Characterization of Buried Nanolayers by Quantitative X-ray Fluorescence Spectrometry under Conventional and Grazing Incidence Conditions. Analytical Chemistry, 83 (22). 8623-8628 doi:10.1021/ac202074s
Beckhoff, Burkhard (2008) Reference-free X-ray spectrometry based on metrology using synchrotron radiation. Journal of Analytical Atomic Spectrometry, 23 (6). 845pp. doi:10.1039/b718355k
Wählisch, André, Streeck, Cornelia, Hönicke, Philipp, Beckhoff, Burkhard (2020) Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films. Journal of Analytical Atomic Spectrometry, 35 (8) 1664-1670 doi:10.1039/d0ja00171f
 
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