Krause, Joern, Scalf, Mark, Smith, Lloyd M. (1999) High resolution characterization of DNA fragment ions produced by ultraviolet matrix-assisted laser desorption/ionization using linear and reflecting time-of-flight mass spectrometry. Journal of the American Society for Mass Spectrometry, 10 (5). 423-429 doi:10.1016/s1044-0305(99)00009-4
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | High resolution characterization of DNA fragment ions produced by ultraviolet matrix-assisted laser desorption/ionization using linear and reflecting time-of-flight mass spectrometry | ||
Journal | Journal of the American Society for Mass Spectrometry | ||
Authors | Krause, Joern | Author | |
Scalf, Mark | Author | ||
Smith, Lloyd M. | Author | ||
Year | 1999 (May) | Volume | 10 |
Issue | 5 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1016/s1044-0305(99)00009-4Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5348738 | Long-form Identifier | mindat:1:5:5348738:8 |
GUID | 0 | ||
Full Reference | Krause, Joern, Scalf, Mark, Smith, Lloyd M. (1999) High resolution characterization of DNA fragment ions produced by ultraviolet matrix-assisted laser desorption/ionization using linear and reflecting time-of-flight mass spectrometry. Journal of the American Society for Mass Spectrometry, 10 (5). 423-429 doi:10.1016/s1044-0305(99)00009-4 | ||
Plain Text | Krause, Joern, Scalf, Mark, Smith, Lloyd M. (1999) High resolution characterization of DNA fragment ions produced by ultraviolet matrix-assisted laser desorption/ionization using linear and reflecting time-of-flight mass spectrometry. Journal of the American Society for Mass Spectrometry, 10 (5). 423-429 doi:10.1016/s1044-0305(99)00009-4 | ||
In | (1999, May) Journal of the American Society for Mass Spectrometry Vol. 10 (5) American Chemical Society (ACS) |
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