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Van Ham, Rita, Van Vaeck, Luc, Adriaens, Annemie, Adams, Freddy, Hodges, Brittany, Appelhans, Anthony, Groenewold, Gary (2005) Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS). International Journal of Mass Spectrometry, 247 (1). 28-36 doi:10.1016/j.ijms.2005.07.010

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Reference TypeJournal (article/letter/editorial)
TitleSemi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS)
JournalInternational Journal of Mass Spectrometry
AuthorsVan Ham, RitaAuthor
Van Vaeck, LucAuthor
Adriaens, AnnemieAuthor
Adams, FreddyAuthor
Hodges, BrittanyAuthor
Appelhans, AnthonyAuthor
Groenewold, GaryAuthor
Year2005 (December)Volume247
Issue1
PublisherElsevier BV
DOIdoi:10.1016/j.ijms.2005.07.010Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5364954Long-form Identifiermindat:1:5:5364954:4
GUID0
Full ReferenceVan Ham, Rita, Van Vaeck, Luc, Adriaens, Annemie, Adams, Freddy, Hodges, Brittany, Appelhans, Anthony, Groenewold, Gary (2005) Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS). International Journal of Mass Spectrometry, 247 (1). 28-36 doi:10.1016/j.ijms.2005.07.010
Plain TextVan Ham, Rita, Van Vaeck, Luc, Adriaens, Annemie, Adams, Freddy, Hodges, Brittany, Appelhans, Anthony, Groenewold, Gary (2005) Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS). International Journal of Mass Spectrometry, 247 (1). 28-36 doi:10.1016/j.ijms.2005.07.010
In(2005, December) International Journal of Mass Spectrometry Vol. 247 (1) Elsevier BV

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Ham, Rita Van, Vaeck, Luc Van, Adriaens, Annemie, Adams, Freddy, Hodges, Brittany, Gianotto, Anita, Avci, Recep, Appelhans, Anthony, Groenewold, Gary (2006) Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates. Talanta, 69 (1). 91-96 doi:10.1016/j.talanta.2005.09.012
Van Ham, Rita, Van Vaeck, Luc, Adriaens, Annemie, Adams, Freddy, Hodges, Brittany, Groenewold, Gary (2002) Inorganic speciation in static SIMS: a comparative study between monatomic and polyatomic primary ions. Journal of Analytical Atomic Spectrometry, 17 (8). 753-758 doi:10.1039/b202225g
Van Ham, Rita, Van Vaeck, Luc, Adams, Freddy, Adriaens, Annemie (2005) Comparison of Ga+ and SF5+ primary ions for the molecular speciation of oxysalts in static secondary ion mass spectrometry (S-SIMS). Journal of Analytical Atomic Spectrometry, 20 (10). 1088pp. doi:10.1039/b506163f
Van Ham, Rita, Van Vaeck, Luc, Adams, Freddy C., Adriaens, Annemie (2004) Systematization of the Mass Spectra for Speciation of Inorganic Salts with Static Secondary Ion Mass Spectrometry. Analytical Chemistry, 76 (9). 2609-2617 doi:10.1021/ac0400156
Ham, Rita Van, Vaeck, Luc Van, Adriaens, Annemie, Adams, Freddy (2003) Static secondary ion mass spectrometry for organic and inorganic molecular analysis in solids. Analytica Chimica Acta, 500 (1). 259-278 doi:10.1016/j.aca.2003.08.068
Adriaens, Annemie, Van Vaeck, Luc, Adams, Freddy (1999) Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications. Mass Spectrometry Reviews, 18 (1). 48-81 doi:10.1002/(sici)1098-2787(1999)18:1<48::aid-mas2>3.0.co;2-i
Van Ham, Rita, Adriaens, Annemie, Van Vaeck, Luc, Adams, Freddy (2006) The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces. Analytica Chimica Acta, 558 (1). 115-124 doi:10.1016/j.aca.2005.11.041
Ham, Rita Van, Adriaens, Annemie, Prati, Paolo, Zucchiatti, Alessandro, Vaeck, Luc Van, Adams, Freddy (2002) Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates. Atmospheric Environment, 36 (5). 899-909 doi:10.1016/s1352-2310(01)00436-8
Van Vaeck, Luc, Adriaens, Annemie, Gijbels, Renaat (1999) Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation. Mass Spectrometry Reviews, 18 (1). 1-47 doi:10.1002/(sici)1098-2787(1999)18:1<1::aid-mas1>3.0.co;2-w
Van Ham, Rita, Van Vaeck, Luc, Adams, Freddy, Adriaens, Annemie (2005) Feasibility of analyzing molecular pigments in paint layers using TOF S–SIMS. Analytical and Bioanalytical Chemistry, 383 (6) 991-997 doi:10.1007/s00216-005-0088-4
Van Royen, Pieter, Taranu, Anca, Van Vaeck, Luc (2005) Comparison of primary monoatomic with primary polyatomic ions for the characterisation of polyesters with static secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry, 19 (4). 552-560 doi:10.1002/rcm.1824
 
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