Van Vaeck, Luc, Adriaens, Annemie, Gijbels, Renaat (1999) Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation. Mass Spectrometry Reviews, 18 (1). 1-47 doi:10.1002/(sici)1098-2787(1999)18:1<1::aid-mas1>3.0.co;2-w
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation | ||
Journal | Mass Spectrometry Reviews | ||
Authors | Van Vaeck, Luc | Author | |
Adriaens, Annemie | Author | ||
Gijbels, Renaat | Author | ||
Year | 1999 | Volume | 18 |
Issue | 1 | ||
Publisher | Wiley | ||
DOI | doi:10.1002/(sici)1098-2787(1999)18:1<1::aid-mas1>3.0.co;2-wSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5432977 | Long-form Identifier | mindat:1:5:5432977:1 |
GUID | 0 | ||
Full Reference | Van Vaeck, Luc, Adriaens, Annemie, Gijbels, Renaat (1999) Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation. Mass Spectrometry Reviews, 18 (1). 1-47 doi:10.1002/(sici)1098-2787(1999)18:1<1::aid-mas1>3.0.co;2-w | ||
Plain Text | Van Vaeck, Luc, Adriaens, Annemie, Gijbels, Renaat (1999) Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation. Mass Spectrometry Reviews, 18 (1). 1-47 doi:10.1002/(sici)1098-2787(1999)18:13.0.co;2-w | ||
In | (1999) Mass Spectrometry Reviews Vol. 18 (1) Wiley |
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