Takabayashi, Y., Sumitani, K. (2013) New method for measuring beam profiles using a parametric X-ray pinhole camera. Physics Letters A, 377. 2577-2580 doi:10.1016/j.physleta.2013.07.035
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | New method for measuring beam profiles using a parametric X-ray pinhole camera | ||
Journal | Physics Letters A | ||
Authors | Takabayashi, Y. | Author | |
Sumitani, K. | Author | ||
Year | 2013 (November) | Volume | 377 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.physleta.2013.07.035Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5567937 | Long-form Identifier | mindat:1:5:5567937:2 |
GUID | 0 | ||
Full Reference | Takabayashi, Y., Sumitani, K. (2013) New method for measuring beam profiles using a parametric X-ray pinhole camera. Physics Letters A, 377. 2577-2580 doi:10.1016/j.physleta.2013.07.035 | ||
Plain Text | Takabayashi, Y., Sumitani, K. (2013) New method for measuring beam profiles using a parametric X-ray pinhole camera. Physics Letters A, 377. 2577-2580 doi:10.1016/j.physleta.2013.07.035 | ||
In | (2012) Physics Letters A Vol. 377. Elsevier BV |
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