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Elleaume, P., Fortgang, C., Penel, C., Tarazona, E. (1995) Measuring Beam Sizes and Ultra-Small Electron Emittances Using an X-ray Pinhole Camera. Journal of Synchrotron Radiation, 2 (5). 209-214 doi:10.1107/s0909049595008685

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Reference TypeJournal (article/letter/editorial)
TitleMeasuring Beam Sizes and Ultra-Small Electron Emittances Using an X-ray Pinhole Camera
JournalJournal of Synchrotron Radiation
AuthorsElleaume, P.Author
Fortgang, C.Author
Penel, C.Author
Tarazona, E.Author
Year1995 (September 1)Volume2
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049595008685Search in ResearchGate
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Mindat Ref. ID8481803Long-form Identifiermindat:1:5:8481803:2
GUID0
Full ReferenceElleaume, P., Fortgang, C., Penel, C., Tarazona, E. (1995) Measuring Beam Sizes and Ultra-Small Electron Emittances Using an X-ray Pinhole Camera. Journal of Synchrotron Radiation, 2 (5). 209-214 doi:10.1107/s0909049595008685
Plain TextElleaume, P., Fortgang, C., Penel, C., Tarazona, E. (1995) Measuring Beam Sizes and Ultra-Small Electron Emittances Using an X-ray Pinhole Camera. Journal of Synchrotron Radiation, 2 (5). 209-214 doi:10.1107/s0909049595008685
In(1995, September) Journal of Synchrotron Radiation Vol. 2 (5) International Union of Crystallography (IUCr)


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