Chu, C.H., Tsai, E.L., Chao, W.Y., Chen, L.J. (1991) Annealing behaviors of residual defects in high-dose BF+2-implanted (001)Si under different implantation conditions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 193-197 doi:10.1016/0168-583x(91)96160-m
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Annealing behaviors of residual defects in high-dose BF+2-implanted (001)Si under different implantation conditions | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Chu, C.H. | Author | |
Tsai, E.L. | Author | ||
Chao, W.Y. | Author | ||
Chen, L.J. | Author | ||
Year | 1991 (April) | Volume | 55 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(91)96160-mSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5596287 | Long-form Identifier | mindat:1:5:5596287:4 |
GUID | 0 | ||
Full Reference | Chu, C.H., Tsai, E.L., Chao, W.Y., Chen, L.J. (1991) Annealing behaviors of residual defects in high-dose BF+2-implanted (001)Si under different implantation conditions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 193-197 doi:10.1016/0168-583x(91)96160-m | ||
Plain Text | Chu, C.H., Tsai, E.L., Chao, W.Y., Chen, L.J. (1991) Annealing behaviors of residual defects in high-dose BF+2-implanted (001)Si under different implantation conditions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 193-197 doi:10.1016/0168-583x(91)96160-m | ||
In | (1991, April) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 55 (1) Elsevier BV |
See Also
These are possibly similar items as determined by title/reference text matching only.