Ridgway, M.C., Johnson, S.T., Duckworth, D., Williams, J.S., Bond, P., Byers, P., Chivers, D.J. (1991) In-situ analysis during ion beam modification of Pt-Si structures. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 59. 164-167 doi:10.1016/0168-583x(91)95199-n
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In-situ analysis during ion beam modification of Pt-Si structures | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Ridgway, M.C. | Author | |
Johnson, S.T. | Author | ||
Duckworth, D. | Author | ||
Williams, J.S. | Author | ||
Bond, P. | Author | ||
Byers, P. | Author | ||
Chivers, D.J. | Author | ||
Year | 1991 (July) | Volume | 59 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(91)95199-nSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5597538 | Long-form Identifier | mindat:1:5:5597538:2 |
GUID | 0 | ||
Full Reference | Ridgway, M.C., Johnson, S.T., Duckworth, D., Williams, J.S., Bond, P., Byers, P., Chivers, D.J. (1991) In-situ analysis during ion beam modification of Pt-Si structures. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 59. 164-167 doi:10.1016/0168-583x(91)95199-n | ||
Plain Text | Ridgway, M.C., Johnson, S.T., Duckworth, D., Williams, J.S., Bond, P., Byers, P., Chivers, D.J. (1991) In-situ analysis during ion beam modification of Pt-Si structures. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 59. 164-167 doi:10.1016/0168-583x(91)95199-n | ||
In | (1991) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 59. Elsevier BV |
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