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Fukushima, K, Kawakatsu, H, Fukami, A (1974) Fresnel fringes in electron microscope images. Journal of Physics D: Applied Physics, 7. 257-266 doi:10.1088/0022-3727/7/2/310

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Reference TypeJournal (article/letter/editorial)
TitleFresnel fringes in electron microscope images
JournalJournal of Physics D: Applied Physics
AuthorsFukushima, KAuthor
Kawakatsu, HAuthor
Fukami, AAuthor
Year1974 (January 21)Volume7
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/7/2/310Search in ResearchGate
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Mindat Ref. ID5659105Long-form Identifiermindat:1:5:5659105:3
GUID0
Full ReferenceFukushima, K, Kawakatsu, H, Fukami, A (1974) Fresnel fringes in electron microscope images. Journal of Physics D: Applied Physics, 7. 257-266 doi:10.1088/0022-3727/7/2/310
Plain TextFukushima, K, Kawakatsu, H, Fukami, A (1974) Fresnel fringes in electron microscope images. Journal of Physics D: Applied Physics, 7. 257-266 doi:10.1088/0022-3727/7/2/310
In(1974) Journal of Physics D: Applied Physics Vol. 7. IOP Publishing

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Gibbons, D J (1974) Trapped space charges in electron-bombarded insulators. Journal of Physics D: Applied Physics, 7. 433-442 doi:10.1088/0022-3727/7/3/310
Joachim, Frank (1974) Radiation damage assessment from electron images using digital correlation methods. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/7/101
Misell, D L, Stroke, G W, Halioua, M (1974) Coherent and incoherent imaging in the scanning transmission electron microscope. Journal of Physics D: Applied Physics, 7. doi:10.1088/0022-3727/7/10/103
Sugihara, K, Harada, Y, Yotsumoto, H, Fukami, A, Kanaya, K (1968) Scattering by specimen-supporting films in electron microscopy and its effect on Fresnel fringe formation. Journal of Physics D: Applied Physics, 1. 87-97 doi:10.1088/0022-3727/1/1/313
Hirsch, E H, Varga, I K (1974) Thermionic emission of positive ions from alkali tantalates. Journal of Physics D: Applied Physics, 7. 2355-2361 doi:10.1088/0022-3727/7/17/310
Byckling, Eero (1974) Wave propagation in optical systems. Journal of Physics D: Applied Physics, 7. 824-831 doi:10.1088/0022-3727/7/6/310
Birdseye, P J, Smith, D A, Smith, G D W (1974) Analogue investigations of electric field distribution and ion trajectories in the field ion microscope. Journal of Physics D: Applied Physics, 7. 1642-1651 doi:10.1088/0022-3727/7/12/310
Sandström, Rolf, Spencer, Jonathan F, Humphreys, Colin J (1974) A theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy. Journal of Physics D: Applied Physics, 7. 1030-1046 doi:10.1088/0022-3727/7/7/310
Curtis, G H, Ferrier, R P (1969) The electric charging of electron-microscope specimens. Journal of Physics D: Applied Physics, 2. 1035-1040 doi:10.1088/0022-3727/2/7/312
Kanaya, Koichi, Kawakatsu, Hisazo, Atoda, Nobufumi, Yotsumoto, Haruo, Ono, Akishige (1973) Quantitative analysis of electron microscope images recorded on thin polymer films. Journal of Physics D: Applied Physics, 6. 6-20 doi:10.1088/0022-3727/6/1/306
Dobbs, H S (1974) Vitreous carbon and the brittle fracture of amorphous solids. Journal of Physics D: Applied Physics, 7. 24-31 doi:10.1088/0022-3727/7/1/310
 
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